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Title: Method and apparatus for selective and power-aware memory error protection and memory management

Patent ·
OSTI ID:1495044

A method for providing selective memory error protection responsive to a predictable failure notification associated with at least one portion of a memory in a computing system includes: obtaining an active error correcting code (ECC) configuration corresponding to the portion of the memory; determining whether the active ECC configuration is sufficient to correct at least one error in the portion of the memory affected by the predictable failure notification; when the active ECC configuration is insufficient to correct the error, determining whether data corruption can be tolerated by an application running on the computing system; when data corruption cannot be tolerated by the application, determining whether a stronger ECC level is available and, if a stronger ECC level is available, increasing a strength of the active ECC configuration; and when data corruption can be tolerated, performing page reassignment and aggregation of non-critical data.

Research Organization:
International Business Machines Corp., Armonk, NY (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
B599858
Assignee:
International Business Machines Corporation (Armonk, NY)
Patent Number(s):
10,141,955
Application Number:
14/684,368
OSTI ID:
1495044
Resource Relation:
Patent File Date: 2015 Apr 11
Country of Publication:
United States
Language:
English

References (9)

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System and method for exchanging data patent June 2004
Flikker: saving DRAM refresh-power through critical data partitioning
  • Liu, Song; Pattabiraman, Karthik; Moscibroda, Thomas
  • Proceedings of the sixteenth international conference on Architectural support for programming languages and operating systems - ASPLOS '11 https://doi.org/10.1145/1950365.1950391
conference January 2011
Energy-efficient cache design using variable-strength error-correcting codes conference January 2011
SECRET: Selective error correction for refresh energy reduction in DRAMs
  • Lin, Chung-Hsiang; Shen, De-Yu; Chen, Yi-Jung
  • 2012 IEEE 30th International Conference on Computer Design (ICCD 2012), 2012 IEEE 30th International Conference on Computer Design (ICCD) https://doi.org/10.1109/ICCD.2012.6378619
conference September 2012
SafeMem: Exploiting ECC-Memory for Detecting Memory Leaks and Memory Corruption During Production Runs conference January 2005
Method and apparatus for using wear-out blocks in nonvolatile memory patent August 2016
MAGE: Adaptive Granularity and ECC for resilient and power efficient memory systems
  • Li, Sheng; Yoon, Doe Hyun; Chen, Ke
  • 2012 SC - International Conference for High Performance Computing, Networking, Storage and Analysis, 2012 International Conference for High Performance Computing, Networking, Storage and Analysis https://doi.org/10.1109/SC.2012.73
conference November 2012

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