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Title: Capacitance of a Ge/SiGe heterostructure field-effect transistor

Technical Report ·
DOI:https://doi.org/10.2172/1484586· OSTI ID:1484586
 [1];  [2]
  1. Florida State Univ., Tallahassee, FL (United States)
  2. Sandia National Lab. (SNL-CA), Livermore, CA (United States); Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

In this project we studied undoped Ge/SiGe heterostructure field-effect transistors, which had a very wide hole density range from 1x1010cm-2 to 3.5x1011 cm-2 tunable by (negative) gate voltage. At low temperatures reasonably high carriers mobility of about 3.4x105 cm2/Vs was achieved.

Research Organization:
Sandia National Lab. (SNL-CA), Livermore, CA (United States); Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000; NA0003525
OSTI ID:
1484586
Report Number(s):
SAND-2018-13502R; 670589
Country of Publication:
United States
Language:
English