Switching Reliability Characterization of Vertical GaN PiN Diodes.
Conference
·
OSTI ID:1470826
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE Office of Electricity (OE), Advanced Grid Research & Development. Power Systems Engineering Research
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1470826
- Report Number(s):
- SAND2017-9588C; 656810
- Resource Relation:
- Conference: Proposed for presentation at the 2017 Electrical Energy Storage Applications and Technologies (EESAT) held October 11-13, 2017 in San Diego, CA, United States.
- Country of Publication:
- United States
- Language:
- English
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