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Title: In situ X-Ray Diffraction of Shock-Compressed Fused Silica

Journal Article · · Physical Review Letters
 [1];  [2];  [1]
  1. Princeton Univ., NJ (United States)
  2. Washington State Univ., Pullman, WA (United States)

Because of its widespread applications in materials science and geophysics, SiO 2 has been extensively examined under shock compression. Both quartz and fused silica transform through a so-called “mixed-phase region” to a dense, low compressibility high-pressure phase. For decades, the nature of this phase has been a subject of debate. Proposed structures include crystalline stishovite, another high-pressure crystalline phase, or a dense amorphous phase. Here we use plate-impact experiments and pulsed synchrotron x-ray diffraction to examine the structure of fused silica shock compressed to 63 GPa. In contrast to recent laser-driven compression experiments, we find that fused silica adopts a dense amorphous structure at 34 GPa and below. When compressed above 34 GPa, fused silica transforms to untextured polycrystalline stishovite. Our results can explain previously ambiguous features of the shock-compression behavior of fused silica and are consistent with recent molecular dynamics simulations. Stishovite grain sizes are estimated to be ~5–30nm for compression over a few hundred nanosecond time scale.

Research Organization:
Washington State Univ., Pullman, WA (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
NA0002442; NA0002007; AC02-06CH11357
OSTI ID:
1464952
Alternate ID(s):
OSTI ID: 1430380; OSTI ID: 1476635
Journal Information:
Physical Review Letters, Vol. 120, Issue 13; ISSN 0031-9007
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 43 works
Citation information provided by
Web of Science

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Cited By (1)

Nanosecond Melting and Recrystallization in Shock-Compressed Silicon journal September 2018

Figures / Tables (4)


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