Atomic Force Microscopy Beyond the Standard Quantum Limit

Conference · Tue May 01 00:00:00 EDT 2018

DOI:https://doi.org/10.1364/CLEO_AT.2018.JF2B.3· OSTI ID:1461044

Lawrie, Benjamin J.  ^[1]; Pooser, Raphael C.  ^[1]

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1. ORNL

We explore the impact of quantum noise reduction on force microscopy for broadband off-resonant materials characterization by integrating a multi-spatial-mode squeezed state as the readout field in a commercially available microscope.

• Research Organization: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
• Sponsoring Organization: USDOE
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1461044
• Resource Relation: Conference: CLEO: Applications and Technology 2018 - San Jose, California, United States of America - 5/13/2018 12:00:00 PM-5/18/2018 12:00:00 PM
• Country of Publication: United States
• Language: English