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Title: Measurement of low energy ionization signals from Compton scattering in a charge-coupled device dark matter detector [Measurement of low energy ionization signals from Compton scattering in a CCD dark matter detector]

Journal Article · · Physical Review D
 [1];  [2];  [1];  [1];  [2];  [1];  [1];  [1];  [3];  [3];  [4]
  1. The Univ. of Chicago, Chicago, IL (United States)
  2. Univ. of Michigan, Ann Arbor, MI (United States)
  3. Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
  4. Univ. Nacional de Asuncion, Asuncion (Paraguay)

In this paper, an important source of background in direct searches for low-mass dark matter particles are the energy deposits by small-angle scattering of environmental γ rays. We report detailed measurements of low-energy spectra from Compton scattering of γ rays in the bulk silicon of a charge-coupled device (CCD). Electron recoils produced by γ rays from 57Co and 241Am radioactive sources are measured between 60 eV and 4 keV. The observed spectra agree qualitatively with theoretical predictions, and characteristic spectral features associated with the atomic structure of the silicon target are accurately measured for the first time. A theoretically motivated parametrization of the data that describes the Compton spectrum at low energies for any incident γ-ray flux is derived. The result is directly applicable to background estimations for low-mass dark matter direct-detection experiments based on silicon detectors, in particular for the DAMIC experiment down to its current energy threshold.

Research Organization:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP)
Grant/Contract Number:
AC02-07CH11359
OSTI ID:
1459593
Report Number(s):
FERMILAB-PUB-17-221-AE; arXiv:1706.06053; PRVDAQ; 1605730; TRN: US1901579
Journal Information:
Physical Review D, Vol. 96, Issue 4; ISSN 2470-0010
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 17 works
Citation information provided by
Web of Science

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Figures / Tables (11)