Measurement of low energy ionization signals from Compton scattering in a charge-coupled device dark matter detector [Measurement of low energy ionization signals from Compton scattering in a CCD dark matter detector]
- The Univ. of Chicago, Chicago, IL (United States)
- Univ. of Michigan, Ann Arbor, MI (United States)
- Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
- Univ. Nacional de Asuncion, Asuncion (Paraguay)
In this paper, an important source of background in direct searches for low-mass dark matter particles are the energy deposits by small-angle scattering of environmental γ rays. We report detailed measurements of low-energy spectra from Compton scattering of γ rays in the bulk silicon of a charge-coupled device (CCD). Electron recoils produced by γ rays from 57Co and 241Am radioactive sources are measured between 60 eV and 4 keV. The observed spectra agree qualitatively with theoretical predictions, and characteristic spectral features associated with the atomic structure of the silicon target are accurately measured for the first time. A theoretically motivated parametrization of the data that describes the Compton spectrum at low energies for any incident γ-ray flux is derived. The result is directly applicable to background estimations for low-mass dark matter direct-detection experiments based on silicon detectors, in particular for the DAMIC experiment down to its current energy threshold.
- Research Organization:
- Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), High Energy Physics (HEP)
- Grant/Contract Number:
- AC02-07CH11359
- OSTI ID:
- 1459593
- Report Number(s):
- FERMILAB-PUB-17-221-AE; arXiv:1706.06053; PRVDAQ; 1605730; TRN: US1901579
- Journal Information:
- Physical Review D, Vol. 96, Issue 4; ISSN 2470-0010
- Publisher:
- American Physical Society (APS)Copyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
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