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Title: SRF Cavity Testing Using a FPGA Self Excited Loop

Abstract

This document provides a detailed description of procedures for very-high precision calibration and testing of superconducting RF cavities using digital Low-Level RF (LLRF) electronics based on Field Programmable Gate Arrays (FPGA). The use of a Self-Excited Loop with an innovative procedure for fast turn-on allows the measurement of the forward, reflected and transmitted power from a single port of the directional coupler in front of the cavity, thus eliminating certain measurement errors. Various procedures for measuring the quality factor as a function of cavity fields are described, including a single RF pulse technique. Errors are estimated for the measurements.

Authors:
 [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States); Stony Brook Univ., Stony Brook, NY (United States); European Organization for Nuclear Research (CERN), Geneva (Switzerland)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Nuclear Physics (NP)
OSTI Identifier:
1458517
Report Number(s):
C-A/AP/591; CERN-ACC-NOTE-2018-0039; BNL-114286-2017-TECH
TRN: US1901674
DOE Contract Number:  
SC0012704
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS

Citation Formats

Ben-Zvi, Ilan. SRF Cavity Testing Using a FPGA Self Excited Loop. United States: N. p., 2017. Web. doi:10.2172/1458517.
Ben-Zvi, Ilan. SRF Cavity Testing Using a FPGA Self Excited Loop. United States. https://doi.org/10.2172/1458517
Ben-Zvi, Ilan. 2017. "SRF Cavity Testing Using a FPGA Self Excited Loop". United States. https://doi.org/10.2172/1458517. https://www.osti.gov/servlets/purl/1458517.
@article{osti_1458517,
title = {SRF Cavity Testing Using a FPGA Self Excited Loop},
author = {Ben-Zvi, Ilan},
abstractNote = {This document provides a detailed description of procedures for very-high precision calibration and testing of superconducting RF cavities using digital Low-Level RF (LLRF) electronics based on Field Programmable Gate Arrays (FPGA). The use of a Self-Excited Loop with an innovative procedure for fast turn-on allows the measurement of the forward, reflected and transmitted power from a single port of the directional coupler in front of the cavity, thus eliminating certain measurement errors. Various procedures for measuring the quality factor as a function of cavity fields are described, including a single RF pulse technique. Errors are estimated for the measurements.},
doi = {10.2172/1458517},
url = {https://www.osti.gov/biblio/1458517}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Aug 30 00:00:00 EDT 2017},
month = {Wed Aug 30 00:00:00 EDT 2017}
}