Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope
Abstract
Here, an accelerator-based MeV ultrafast electron microscope (MUEM) has been proposed as a promising tool to the study structural dynamics at the nanometer spatial scale and the picosecond temporal scale. Here, we report experimental tests of a prototype MUEM where high quality images with nanoscale fine structures were recorded with a pulsed ~3 MeV picosecond electron beam. The temporal and spatial resolutions of the MUEM operating in the single-shot mode are about 4 ps (FWHM) and 100 nm (FWHM), corresponding to a temporal-spatial resolution of 4 × 10–19 sm, about 2 orders of magnitude higher than that achieved with state-of-the-art single-shot keV UEM. Using this instrument, we offer the demonstration of visualizing the nanoscale periodic spatial modulation of an electron beam, which may be converted into longitudinal density modulation through emittance exchange to enable production of high-power coherent radiation at short wavelengths. Our results mark a great step towards single-shot nanometer-resolution MUEMs and compact intense x-ray sources that may have widespread applications in many areas of science.
- Authors:
-
- Shanghai Jiao Tong Univ., Shanghai (China)
- Peking Univ., Beijing (China)
- Peking Univ., Beijing (China); Southern Univ. of Science and Technology, Shenzhen (China)
- ShanghaiTech Univ., Shanghai (China)
- Brookhaven National Lab. (BNL), Upton, NY (United States); Stony Brook Univ., Stony Brook, NY (United States)
- Shanghai Jiao Tong Univ., Shanghai (China); Tsung-Dao Lee Institute, Shanghai (China)
- Publication Date:
- Research Org.:
- Brookhaven National Laboratory (BNL), Upton, NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1439294
- Report Number(s):
- BNL-205702-2018-JAAM
Journal ID: ISSN 0003-6951; TRN: US1900595
- Grant/Contract Number:
- SC0012704
- Resource Type:
- Journal Article: Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 112; Journal Issue: 11; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY
Citation Formats
Lu, Chao, Jiang, Tao, Liu, Shengguang, Wang, Rui, Zhao, Lingrong, Zhu, Pengfei, Liu, Yaqi, Xu, Jun, Yu, Dapeng, Wan, Weishi, Zhu, Yimei, Xiang, Dao, and Zhang, Jie. Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope. United States: N. p., 2018.
Web. doi:10.1063/1.5023179.
Lu, Chao, Jiang, Tao, Liu, Shengguang, Wang, Rui, Zhao, Lingrong, Zhu, Pengfei, Liu, Yaqi, Xu, Jun, Yu, Dapeng, Wan, Weishi, Zhu, Yimei, Xiang, Dao, & Zhang, Jie. Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope. United States. https://doi.org/10.1063/1.5023179
Lu, Chao, Jiang, Tao, Liu, Shengguang, Wang, Rui, Zhao, Lingrong, Zhu, Pengfei, Liu, Yaqi, Xu, Jun, Yu, Dapeng, Wan, Weishi, Zhu, Yimei, Xiang, Dao, and Zhang, Jie. 2018.
"Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope". United States. https://doi.org/10.1063/1.5023179. https://www.osti.gov/servlets/purl/1439294.
@article{osti_1439294,
title = {Imaging nanoscale spatial modulation of a relativistic electron beam with a MeV ultrafast electron microscope},
author = {Lu, Chao and Jiang, Tao and Liu, Shengguang and Wang, Rui and Zhao, Lingrong and Zhu, Pengfei and Liu, Yaqi and Xu, Jun and Yu, Dapeng and Wan, Weishi and Zhu, Yimei and Xiang, Dao and Zhang, Jie},
abstractNote = {Here, an accelerator-based MeV ultrafast electron microscope (MUEM) has been proposed as a promising tool to the study structural dynamics at the nanometer spatial scale and the picosecond temporal scale. Here, we report experimental tests of a prototype MUEM where high quality images with nanoscale fine structures were recorded with a pulsed ~3 MeV picosecond electron beam. The temporal and spatial resolutions of the MUEM operating in the single-shot mode are about 4 ps (FWHM) and 100 nm (FWHM), corresponding to a temporal-spatial resolution of 4 × 10–19 sm, about 2 orders of magnitude higher than that achieved with state-of-the-art single-shot keV UEM. Using this instrument, we offer the demonstration of visualizing the nanoscale periodic spatial modulation of an electron beam, which may be converted into longitudinal density modulation through emittance exchange to enable production of high-power coherent radiation at short wavelengths. Our results mark a great step towards single-shot nanometer-resolution MUEMs and compact intense x-ray sources that may have widespread applications in many areas of science.},
doi = {10.1063/1.5023179},
url = {https://www.osti.gov/biblio/1439294},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 11,
volume = 112,
place = {United States},
year = {Mon Mar 12 00:00:00 EDT 2018},
month = {Mon Mar 12 00:00:00 EDT 2018}
}
Web of Science
Figures / Tables:
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