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Title: Analyzing shear band formation with high resolution X-ray diffraction

Journal Article · · Acta Materialia
 [1];  [2];  [3];  [4]
  1. Cornell Univ., Ithaca, NY (United States). Cornell High Energy Synchrotron Source (CHESS)
  2. Cornell Univ., Ithaca, NY (United States). Sibley School of Mechanical and Aerospace Engineering
  3. Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
  4. Cornell Univ., Ithaca, NY (United States). Cornell High Energy Synchrotron Source (CHESS); Cornell Univ., Ithaca, NY (United States). Sibley School of Mechanical and Aerospace Engineering
+ Show Author Affiliations

Localization of crystallographic slip into shear bands during uniaxial compression of a copper single crystal is studied using very far-field high-energy diffraction microscopy (vff-HEDM). Diffracted intensity was collected in-situ as the crystal deformed using a unique mobile detector stage that provided access to multiple diffraction peaks with high-angular resolution. From the diffraction data, single crystal orientation pole figures (SCPFs) were generated and are used to track the evolution of the distribution of lattice orientation that develops as slip localizes. To aid the identification of 'signatures' of shear band formation and analyze the SCPF data, a model of slip-driven lattice reorientation within shear bands is introduced. Confidence is built in conclusions drawn from the SCPF data about the character of internal slip localization through comparisons with strain fields on the sample surface measured simultaneously using digital image correlation. From the diffraction data, we find that the active slip direction and slip plane are not directly aligned with the orientation of the shear bands that formed. In fact, by extracting the underlying slip system activity from the SCPF data, we show that intersecting shear bands measured on the surface of the sample arise from slip primarily on the same underlying single slip system. These new vff-HEDM results raise significant questions on the use of surface measurements for slip system activity estimation. (C) 2018 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); National Science Foundation (NSF)
Grant/Contract Number:
AC52-07NA27344; AC02-06CH11357; LLNL-JRNL-683851
OSTI ID:
1438793
Alternate ID(s):
OSTI ID: 1432370; OSTI ID: 1548805
Report Number(s):
LLNL-JRNL-683851
Journal Information:
Acta Materialia, Vol. 147, Issue C; ISSN 1359-6454
Publisher:
ElsevierCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 17 works
Citation information provided by
Web of Science

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Cited By (2)

Statistical Characterization of Intragrain Misorientations at Large Strains Using High-Energy X-Ray Diffraction: Application to Hydrogen Embrittlement journal September 2019
Shear banding mechanism in compressed nanocrystalline ceramic nanopillars journal August 2019

Figures / Tables (16)

Figure 1(p. 33)figure Figure 1
Figure 2(p. 34)figure Figure 2
Figure 3(p. 35)figure Figure 3
Figure 4(p. 36)figure Figure 4
Figure 5(p. 37)figure Figure 5
Figure 6(p. 38)figure Figure 6
Figure 7(p. 39)figure Figure 7
Figure 8(p. 40)figure Figure 8
Figure 9(p. 41)figure Figure 9
Figure 10(p. 42)figure Figure 10
Figure 11(p. 43)figure Figure 11
Figure 12(p. 44)figure Figure 12
Table 1(p. 45)table Table 1
Table 2(p. 46)table Table 2
Table 3(p. 47)table Table 3
Table 4(p. 48)table Table 4

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Related Subjects

36 MATERIALS SCIENCE
Shear band
OFHC copper
X-ray diffraction
Crystal plasticity