skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: High-Temperature Annealing of CdZnTe Detectors

Journal Article · · IEEE Transactions on Nuclear Science
 [1];  [1];  [1]; ORCiD logo [2];  [3];  [4];  [1]; ORCiD logo [5]
  1. Korea Univ., Sejong (South Korea)
  2. Kyushu Univ., Fukuoka (Japan)
  3. Brookhaven National Lab. (BNL), Upton, NY (United States)
  4. Savannah River National Lab., Aiken, SC (United States)
  5. Korea Univ., Seoul (South Korea)
+ Show Author Affiliations

The electrical properties of CdZnTe(CZT) above the melting point of tellurium (Te) inclusions were determined during in situ annealing. The thermal annealing cycles of the CZT detectors were 490 °C, 530 °C, and 570 °C continuously, which were higher than the melting points of elemental Te and Te inclusions and lower than the sublimation temperature of CZT. Unexpectedly, the CZT detectors exhibited very low leakage current at room temperature after the thermal annealing cycles due to the formation of rectifying contacts. The activation energy of high-resistivity CZT was 0.81 eV indicating pinning of Fermi level nearly in the middle of bandgap. At room temperature, CZT detectors with rectifying contacts showed clearly the 59.5-keV gamma-ray peak of Am-241. As a result, observed fluctuations of the leakage current at about 470 °C might have originated from a mixed conductivity of liquid and solid CZT due to the melting of Te inclusions.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA), Office of Nonproliferation and Verification Research and Development (NA-22)
Grant/Contract Number:
SC0012704
OSTI ID:
1435728
Report Number(s):
BNL-203579-2018-JAAM; TRN: US1900093
Journal Information:
IEEE Transactions on Nuclear Science, Vol. 64, Issue 12; ISSN 0018-9499
Publisher:
IEEECopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 2 works
Citation information provided by
Web of Science

Figures / Tables (8)

Fig. 1(p. 4)figure Fig. 1
Fig. 2(p. 4)figure Fig. 2
Fig. 3(p. 4)figure Fig. 3
Fig. 4(p. 5)figure Fig. 4
Fig. 5(p. 5)figure Fig. 5
Fig. 6(p. 5)figure Fig. 6
Fig. 7(p. 5)figure Fig. 7
Fig. 8(p. 6)figure Fig. 8

Similar Records

Post-Growth Annealing of Bridgman-grown CdZnTe and CdMnTe Crystals for Room-temperature Nuclear Radiation Detectors
Journal Article · Wed Feb 11 00:00:00 EST 2015 · Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment · OSTI ID:1435728
+7 more
Effects of chemo-mechanical polishing on CdZnTe X-ray and gamma-ray detectors
Journal Article · Tue Jun 23 00:00:00 EDT 2015 · Journal of Electronic Materials · OSTI ID:1435728
+2 more
High-resolution p-i-n CdTe and CdZnTe x-ray detectors with cooling and rise-time discrimination
Journal Article · Sat Jun 01 00:00:00 EDT 1996 · IEEE Transactions on Nuclear Science · OSTI ID:1435728

Related Subjects

36 MATERIALS SCIENCE
CdZnTe (CZT)
CZT detectors