High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering

Said, Ayman H.; Gog, Thomas; Wieczorek, Michael; Huang, XianRong; Casa, Diego; Kasman, Elina; Divan, Ralu; Kim, Jung Ho

doi:10.1107/S1600577517018185

Title: High-energy-resolution diced spherical quartz analyzers for resonant inelastic X-ray scattering

Journal Article · Thu Feb 15 00:00:00 EST 2018 · Journal of Synchrotron Radiation (Online)

DOI:https://doi.org/10.1107/S1600577517018185· OSTI ID:1427249

Said, Ayman H. ^[1]; Gog, Thomas ^[1]; Wieczorek, Michael ^[1]; Huang, XianRong ^[1]; Casa, Diego ^[1]; Kasman, Elina ^[1]; Divan, Ralu ^[1]; Kim, Jung Ho ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States)

A novel diced spherical quartz analyzer for use in resonant inelastic X-ray scattering (RIXS) is introduced, achieving an unprecedented energy resolution of 10.53 meV at the IrL₃absorption edge (11.215 keV). In this work the fabrication process and the characterization of the analyzer are presented, and an example of a RIXS spectrum of magnetic excitations in a Sr₃Ir₂O₇sample is shown.

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Research Organization:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-06CH11357

OSTI ID:: 1427249

Journal Information:: Journal of Synchrotron Radiation (Online), Vol. 25, Issue 2; ISSN 1600-5775

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 9 works

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References (11)

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Large Spin-Wave Energy Gap in the Bilayer Iridate ${Sr}_{3} {Ir}_{2} O_{7}$ : Evidence for Enhanced Dipolar Interactions Near the Mott Metal-Insulator Transition Kim, Jungho; Said, A. H.; Casa, D. Physical Review Letters, Vol. 109, Issue 15 https://doi.org/10.1103/PhysRevLett.109.157402	journal	October 2012
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Cited By (2)

X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering? Hönnicke, Marcelo Goncalves; Cusatis, Cesar; Conley, Raymond Journal of Applied Crystallography, Vol. 52, Issue 6 https://doi.org/10.1107/s1600576719012925	journal	October 2019
Performance of quartz- and sapphire-based double-crystal high-resolution (∼10 meV) RIXS monochromators under varying power loads Gog, Thomas; Casa, Diego M.; Knopp, Jonathan Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2019-00184	text	January 2018