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Title: A Study of Beam Position Diagnostics with Beam-excited Dipole Higher Order Modes using a Downconverter Test Electronics in Third Harmonic 3.9 GHz Superconducting Accelerating Cavities at FLASH

Journal Article · · TBD
OSTI ID:1419177

Beam-excited higher order modes (HOM) in accelerating cavities contain transverse beam position information. Previous studies have narrowed down three modal options for beam position diagnostics in the third harmonic 3.9 GHz cavities at FLASH. Localized modes in the beam pipes at approximately 4.1 GHz and in the fifth cavity dipole band at approximately 9 GHz were found, that can provide a local measurement of the beam position. In contrast, propagating modes in the first and second dipole bands between 4.2 and 5.5 GHz can reach a better resolution. All the options were assessed with a specially designed test electronics built by Fermilab. The aim is to define a mode or spectral region suitable for the HOM electronics. Two data analysis techniques are used and compared in extracting beam position information from the dipole HOMs: direct linear regression and singular value decomposition. Current experiments suggest a resolution of 50 {\mu}m accuracy in predicting local beam position using modes in the fifth dipole band, and a global resolution of 20 {\mu}m over the complete module. Based on these results we decided to build a HOM electronics for the second dipole band and the fifth dipole band, so that we will have both high resolution measurements for the whole module, and localized measurements for individual cavity. The prototype electronics is being built by Fermilab and planned to be tested in FLASH by the end of 2012.

Research Organization:
Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), High Energy Physics (HEP)
DOE Contract Number:
AC02-07CH11359
OSTI ID:
1419177
Report Number(s):
arXiv:1208.2122; DESY-12-143; FERMILAB-PUB-12-865-AD; 1127264
Journal Information:
TBD, Journal Name: TBD
Country of Publication:
United States
Language:
English