The 88-Inch Cyclotron: A One-Stop Facility for Electronics Radiation and Detector Testing

Kireeff Covo, M.; Albright, R. A.; Ninemire, B. F.; Johnson, M. B.; Hodgkinson, A.; Loew, T.; Benitez, J. Y.; Todd, D. S.; Xie, D. Z.; Perry, T.; Phair, L.; Bernsteiny, L. A.; Bevins, J.; Brown, J. A.; Goldblum, B. L.; Harasty, M.; Harrig, K. P.; Laplace, T. A.; Matthews, E. F.; Bushmaker, A.; Walker, D.; Oklejas, V.; Hopkins, A. R.; Bleuel, D. L.; Chen, J.; Cronin, S. B.

doi:10.1016/j.measurement.2017.10.018

Title: The 88-Inch Cyclotron: A One-Stop Facility for Electronics Radiation and Detector Testing

Journal Article · Sun Oct 01 00:00:00 EDT 2017 · Measurement

DOI:https://doi.org/10.1016/j.measurement.2017.10.018· OSTI ID:1409927

Kireeff Covo, M.; Albright, R. A.; Ninemire, B. F.; Johnson, M. B.; Hodgkinson, A.; Loew, T.; Benitez, J. Y.; Todd, D. S.; Xie, D. Z.; Perry, T.; Phair, L.; Bernsteiny, L. A.; Bevins, J.; Brown, J. A.; Goldblum, B. L.; Harasty, M.; Harrig, K. P.; Laplace, T. A.; Matthews, E. F.; Bushmaker, A. more »

In outer space down to the altitudes routinely flown by larger aircrafts, radiation can pose serious issues for microelectronics circuits. The 88-Inch Cyclotron at Lawrence Berkeley National Laboratory is a sector-focused cyclotron and home of the Berkeley Accelerator Space Effects Facility, where the effects of energetic particles on sensitive microelectronics are studied with the goal of designing electronic systems for the space community. This paper describes the flexibility of the facility and its capabilities for testing the bombardment of electronics by heavy ions, light ions, and neutrons. Experimental capabilities for the generation of neutron beams from deuteron breakups and radiation testing of carbon nanotube field effect transistor will be discussed.

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Research Organization:: Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC52-07NA27344

OSTI ID:: 1409927

Report Number(s):: LLNL-JRNL-738351

Journal Information:: Measurement, Journal Name: Measurement; ISSN 0263-2241

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

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