Modeling quantum yield, emittance, and surface roughness effects from metallic photocathodes

Dimitrov, D. A.; Bell, G. I.; Smedley, J.; Ben-Zvi, I.; Feng, J.; Karkare, S.; Padmore, H. A.

doi:10.1063/1.4996568

Title: Modeling quantum yield, emittance, and surface roughness effects from metallic photocathodes

Journal Article · Thu Oct 26 00:00:00 EDT 2017 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4996568· OSTI ID:1406895

Dimitrov, D. A. ^[1]; Bell, G. I. ^[1]; Smedley, J. ^[2]; Ben-Zvi, I. ^[2];

^[3];

^[4]; Padmore, H. A. ^[3]

Tech-X Corp., Boulder, CO (United States)
Brookhaven National Lab. (BNL), Upton, NY (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States); UCLA, Los Angeles, CA (United States)

Here, detailed measurements of momentum distributions of emitted electrons have allowed the investigation of the thermal limit of the transverse emittance from metal photocathodes. Furthermore, recent developments in material design and growth have resulted in photocathodes that can deliver high quantum efficiency and are sufficiently robust to use in high electric field gradient photoinjectors and free electron lasers. The growth process usually produces photoemissive material layers with rough surface profiles that lead to transverse accelerating fields and possible work function variations, resulting in emittance growth. To better understand the effects of temperature, density of states, and surface roughness on the properties of emitted electrons, we have developed realistic three-dimensional models for photocathode materials with grated surface structures. They include general modeling of electron excitation due to photon absorption, charge transport, and emission from flat and rough metallic surfaces. The models also include image charge and field enhancement effects. We report results from simulations with flat and rough surfaces to investigate how electron scattering, controlled roughness, work function variation, and field enhancement affect emission properties. Comparison of simulation results with measurements of the quantum yield and transverse emittance from flat Sb emission surfaces shows the importance of including efficient modeling of photon absorption, temperature effects, and the material density of states to achieve agreement with the experimental data.

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Research Organization:: Tech-X Corp., Boulder, CO (United States); Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Nuclear Physics (NP)

Grant/Contract Number:: SC0015767; SC0013190; SC0012704

OSTI ID:: 1406895

Alternate ID(s):: OSTI ID: 1405044; OSTI ID: 1412775

Report Number(s):: BNL-114790-2017-JA; TRN: US1703044

Journal Information:: Journal of Applied Physics, Vol. 122, Issue 16; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 9 works

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Brightness of femtosecond nonequilibrium photoemission in metallic photocathodes at wavelengths near the photoemission threshold Bae, Jai Kwan; Bazarov, Ivan; Musumeci, Pietro Journal of Applied Physics, Vol. 124, Issue 24 https://doi.org/10.1063/1.5053082	journal	December 2018
Thermal-field and photoemission from meso- and micro-scale features: Effects of screening and roughness on characterization and simulation Jensen, Kevin L.; McDonald, Michael; Chubenko, Oksana Journal of Applied Physics, Vol. 125, Issue 23 https://doi.org/10.1063/1.5097149	journal	June 2019
Numerical analysis of the notional area in cold field electron emission from arrays Amorim, Mauro V.; Dall’Agnol, Fernando F.; den Engelsen, Daniel Journal of Physics: Condensed Matter, Vol. 30, Issue 38 https://doi.org/10.1088/1361-648x/aadbdf	journal	August 2018
Quantum Efficiency Enhancement of Bialkali Photocathodes by an Atomically Thin Layer on Substrates Yamaguchi, Hisato; Liu, Fangze; DeFazio, Jeffrey physica status solidi (a), Vol. 216, Issue 23 https://doi.org/10.1002/pssa.201970076	journal	October 2019

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