Modeling charged defects and defect levels in semiconductors and oxides with DFT: An improved inside-out perspective.
Conference
·
OSTI ID:1399207
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1399207
- Report Number(s):
- SAND2016-9983PE; 648039
- Resource Relation:
- Conference: Proposed for presentation at the Invited Seminar at EPFL (Ecole Polytechnique F?d?rale Lausanne) held October 17-18, 2016 in Lausanne, Switzerland.
- Country of Publication:
- United States
- Language:
- English
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