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Title: Reliability Characterization of Wide-Bandgap Semiconductor Switches.

Conference ·
OSTI ID:1395735

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE Office of Electricity (OE), Advanced Grid Research & Development. Power Systems Engineering Research
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1395735
Report Number(s):
SAND2016-9431C; 647631
Resource Relation:
Conference: Proposed for presentation at the iStorage DOE/OE Peer Review 2016 held September 26-28, 2016 in Washington, DC, United States.
Country of Publication:
United States
Language:
English