On determination of charge transfer efficiency of thick, fully depleted CCDs with ⁵⁵ Fe x-rays

Journal Article · Sat Jul 01 00:00:00 EDT 2017 · Journal of Instrumentation

DOI:https://doi.org/10.1088/1748-0221/12/07/C07025· OSTI ID:1392232

Yates, D. ^[1]; Kotov, I. ^[2]; Nomerotski, A. ^[2]

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1. Brookhaven National Lab. (BNL), Upton, NY (United States); Pacific Univ., Forest Grove, OR (United States)
2. Brookhaven National Lab. (BNL), Upton, NY (United States)

Charge transfer efficiency (CTE) is one of the most important CCD characteristics. Our paper examines ways to optimize the algorithms used to analyze ⁵⁵Fe x-ray data on the CCDs, as well as explores new types of observables for CTE determination that can be used for testing LSST CCDs. Furthermore, the observables are modeled employing simple Monte Carlo simulations to determine how the charge diffusion in thick, fully depleted silicon affects the measurement. The data is compared to the simulations for one of the observables, integral flux of the x-ray hit.

• Research Organization: Brookhaven National Lab. (BNL), Upton, NY (United States)
• Sponsoring Organization: USDOE Office of Science (SC), High Energy Physics (HEP)
• Grant/Contract Number: SC0012704
• OSTI ID: 1392232
• Report Number(s): BNL-114245-2017-JA
• Journal Information: Journal of Instrumentation, Vol. 12, Issue 07; Conference: Precision Astronomy with Fully Depleted CCDs, Upton, NY (United States), 01-02 Dec 2016; ISSN 1748-0221
• Publisher: Institute of Physics (IOP)
• Country of Publication: United States
• Language: English

Related Subjects

79 ASTRONOMY AND ASTROPHYSICS
charge transport and multiplication in solid media
detector modelling and simulations II
photon detectors for UV
visible and IR photons
image processing