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Title: Identification of an organic semiconductor superlattice structure of pentacene and perfluoro-pentacene through resonant and non-resonant X-ray scattering

Journal Article · · AIP Advances
DOI:https://doi.org/10.1063/1.4936884· OSTI ID:1378623
 [1];  [2];  [3];  [1];  [2];  [3];  [4];  [2]
  1. Humboldt Univ. of Berlin (Germany)
  2. Univ. Tuebingen, Tuebingen (Germany)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)
  4. Univ. of California, Berkeley, CA (United States). Dept. of Physics and Dept. of Chemistry
+ Show Author Affiliations

Highly crystalline and stable molecular superlattices are grown with the smallest possible stacking period using monolayers (MLs) of the organic semiconductors pentacene (PEN) and perfluoro-pentacene (PFP). Superlattice reflections in X-ray reflectivity and their energy dependence in resonant soft X-ray reflectivity measurements show that PFP and PEN MLs indeed alternate even though the coherent ordering is lost after ~ 4 ML. The observed lattice spacing of 15.9 Å in the superlattice is larger than in pure PEN and PFP films, presumably because of more upright standing molecules and lack of interdigitation between the incommensurate crystalline PEN and PFP layers. The findings are important for the development of novel organic quantum optoelectronic devices.

Research Organization:
Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); German research foundation (DFG)
Grant/Contract Number:
AC02-05CH11231
OSTI ID:
1378623
Journal Information:
AIP Advances, Vol. 5, Issue 11; ISSN 2158-3226
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 6 works
Citation information provided by
Web of Science

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Cited By (2)

Molecular Semiconductors for Logic Operations: Dead‐End or Bright Future? journal January 2020
Quantitative resonant soft x-ray reflectivity from an organic semiconductor single crystal journal March 2019

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36 MATERIALS SCIENCE
Superlattices
Thin film structure
Semiconductor growth
Crystal structure
Reflectivity