Increased Throughput and Sensitivity of Synchrotron-Based Characterization for Photovoltaic Materials
- Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Solar Energy Research Institute (Singapore)
- Aalto Univ., Espoo (Finland)
Optimizing photovoltaic (PV) devices requires characterization and optimization across several length scales, from centimeters to nanometers. Synchrotron-based micro-X-ray fluorescence spectromicroscopy (μ-XRF) is a valuable link in the PV-related material and device characterization suite. μ-XRF maps of elemental distributions in PV materials have high spatial resolution and excellent sensitivity and can be measured on absorber materials and full devices. Recently, we implemented on-the-fly data collection (flyscan) at Beamline 2-ID-D at the Advanced Photon Source at Argonne National Laboratory, eliminating a 300 ms per-pixel overhead time. This faster scanning enables high-sensitivity (~1014 atoms/cm2), large-area (10 000s of μm 2), high-spatial resolution (<;200 nm scale) maps to be completed within a practical scanning time. We specifically show that when characterizing detrimental trace metal precipitate distributions in multicrystalline silicon wafers for PV, flyscans can increase the productivity of μ-XRF by an order of magnitude. Additionally, flyscan μ-XRF mapping enables relatively large-area correlative microscopy. As an example, we map the transition metal distribution in a 50 μm-diameter laser-fired contact of a silicon solar cell before and after lasing. As a result, while we focus on μ-XRF of mc-Si wafers for PV, our results apply broadly to synchrotron-based mapping of PV absorbers and devices.
- Research Organization:
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Sponsoring Organization:
- European Research Council (ERC); USDOE Office of Science (SC), Basic Energy Sciences (BES); European Commission, Community Research and Development Information Service (CORDIS), Seventh Framework Programme (FP7); National Science Foundation (NSF)
- Grant/Contract Number:
- AC02-06CH11357
- OSTI ID:
- 1376700
- Journal Information:
- IEEE Journal of Photovoltaics, Vol. 7, Issue 3; ISSN 2156-3381
- Publisher:
- IEEECopyright Statement
- Country of Publication:
- United States
- Language:
- English
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