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Title: Double-shot MeV electron diffraction and microscopy

Abstract

Here in this paper, we study by numerical simulations a time-resolved MeV electron scattering mode where two consecutive electron pulses are used to capture the evolution of a material sample on 10 ps time scales. The two electron pulses are generated by illuminating a photocathode in a radiofrequency photogun by two short laser pulses with adjustable delay. A streak camera/deflecting cavity is used after the sample to project the two electron bunches on two well separated regions of the detector screen. By using sufficiently short pulses, the 2D spatial information from each snapshot can be preserved. This “double-shot” technique enables the efficient capture of irreversible dynamics in both diffraction and imaging modes. Finally, in this work, we demonstrate both modes in start-to-end simulations of the UCLA Pegasus MeV microscope column.

Authors:
 [1];  [1];  [1]
  1. Univ. of California, Los Angeles, CA (United States). Dept. of Physics and Astronomy
Publication Date:
Research Org.:
Radiabeam Technologies, LLC, Santa Monica, CA (United States)
Sponsoring Org.:
USDOE Office of Science (SC); National Science Foundation (NSF)
OSTI Identifier:
1374551
Grant/Contract Number:  
SC0013115; DMR 1548924
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Structural Dynamics
Additional Journal Information:
Journal Volume: 4; Journal Issue: 4; Journal ID: ISSN 2329-7778
Publisher:
American Crystallographic Association/AIP
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; Image sensors; Electron scattering; Electron beams; Time resolved imaging; Spatial resolution

Citation Formats

Musumeci, P., Cesar, D., and Maxson, J. Double-shot MeV electron diffraction and microscopy. United States: N. p., 2017. Web. doi:10.1063/1.4983390.
Musumeci, P., Cesar, D., & Maxson, J. Double-shot MeV electron diffraction and microscopy. United States. https://doi.org/10.1063/1.4983390
Musumeci, P., Cesar, D., and Maxson, J. 2017. "Double-shot MeV electron diffraction and microscopy". United States. https://doi.org/10.1063/1.4983390. https://www.osti.gov/servlets/purl/1374551.
@article{osti_1374551,
title = {Double-shot MeV electron diffraction and microscopy},
author = {Musumeci, P. and Cesar, D. and Maxson, J.},
abstractNote = {Here in this paper, we study by numerical simulations a time-resolved MeV electron scattering mode where two consecutive electron pulses are used to capture the evolution of a material sample on 10 ps time scales. The two electron pulses are generated by illuminating a photocathode in a radiofrequency photogun by two short laser pulses with adjustable delay. A streak camera/deflecting cavity is used after the sample to project the two electron bunches on two well separated regions of the detector screen. By using sufficiently short pulses, the 2D spatial information from each snapshot can be preserved. This “double-shot” technique enables the efficient capture of irreversible dynamics in both diffraction and imaging modes. Finally, in this work, we demonstrate both modes in start-to-end simulations of the UCLA Pegasus MeV microscope column.},
doi = {10.1063/1.4983390},
url = {https://www.osti.gov/biblio/1374551}, journal = {Structural Dynamics},
issn = {2329-7778},
number = 4,
volume = 4,
place = {United States},
year = {Fri May 19 00:00:00 EDT 2017},
month = {Fri May 19 00:00:00 EDT 2017}
}

Journal Article:
Free Publicly Available Full Text
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Cited by: 3 works
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Works referenced in this record:

Experimental Demonstration of Femtosecond Two-Color X-Ray Free-Electron Lasers
journal, March 2013


A new view of the onset of plasticity during the nanoindentation of aluminium
journal, August 2006


Single-Shot MeV Transmission Electron Microscopy with Picosecond Temporal Resolution
journal, August 2014


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  • Dwyer, Jason R.; Hebeisen, Christoph T.; Ernstorfer, Ralph
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  • https://doi.org/10.1098/rsta.2005.1735

Beam dynamics in transverse deflecting rf structures
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High-intensity double-pulse X-ray free-electron laser
journal, March 2015


Capturing ultrafast structural evolutions with a single pulse of MeV electrons: Radio frequency streak camera based electron diffraction
journal, December 2010


4d Ultrafast Electron Diffraction, Crystallography, and Microscopy
journal, May 2006


Single-shot 35 fs temporal resolution electron shadowgraphy
journal, January 2013


Design of a high-flux instrument for ultrafast electron diffraction and microscopy
journal, April 2016


An Atomic-Level View of Melting Using Femtosecond Electron Diffraction
journal, November 2003


Ultrafast Electron Microscopy in Materials Science, Biology, and Chemistry
journal, November 2005


High-intensity double-pulse X-ray free-electron laser
journal, March 2015


A new view of the onset of plasticity during the nanoindentation of aluminium
journal, August 2006


Capturing ultrafast structural evolutions with a single pulse of MeV electrons: Radio frequency streak camera based electron diffraction
journal, December 2010


Design of a high-flux instrument for ultrafast electron diffraction and microscopy
journal, April 2016


Femtosecond electron diffraction: ‘making the molecular movie’
journal, January 2006

  • Dwyer, Jason R.; Hebeisen, Christoph T.; Ernstorfer, Ralph
  • Philosophical Transactions of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 364, Issue 1840
  • https://doi.org/10.1098/rsta.2005.1735

Observation of Time-Domain Modulation of Free-Electron-Laser Pulses by Multipeaked Electron-Energy Spectrum
journal, September 2013


Direct Measurement of Sub-10 fs Relativistic Electron Beams with Ultralow Emittance
journal, April 2017


An Atomic-Level View of Melting Using Femtosecond Electron Diffraction
journal, November 2003


4d Ultrafast Electron Diffraction, Crystallography, and Microscopy
journal, May 2006


Works referencing / citing this record:

Femtosecond phase-transition in hard x-ray excited bismuth
text, January 2019


Femtosecond phase-transition in hard x-ray excited bismuth
journal, January 2019


Femtosecond phase-transition in hard x-ray excited bismuth
journal, January 2019