High-quality II-VI films grown on amorphous substrates using tunable tetradymite templates

Stoica, V. A.; Endicott, L.; Shen, H. H.; Liu, W.; Sun, K.; Uher, C.; Clarke, R.

doi:10.1063/1.4903268

Title: High-quality II-VI films grown on amorphous substrates using tunable tetradymite templates

Journal Article · Wed Dec 03 00:00:00 EST 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4903268· OSTI ID:1370084

Stoica, V. A. ^[1]; Endicott, L. ^[1]; Shen, H. H. ^[2]; Liu, W. ^[1]; Sun, K. ^[2]; Uher, C. ^[1]; Clarke, R. ^[1]

Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Physics
Univ. of Michigan, Ann Arbor, MI (United States). Dept. of Materials Science and Engineering

We demonstrate the growth of highly oriented CdSe and ZnTe films at ~300 °C on amorphous substrates such as glass and flexible polyimide using ultrathin tetradymite buffer layers composed of Sb_xBi_2-xTe₃ alloys lattice-matched to the film overgrowth. This leads to significant improvement of the crystallinity, roughness, grain size, and pit density of the II-VI overlayer along with enhancement of the optoelectronic properties. For example, photoluminescence emission is observed at ~1.74 eV for optimized CdSe films, the same as in a single crystal reference. An in-plane carrier diffusion length of ~500 nm is inferred from transient optical data. The use of tetradymite buffer layers to control II-VI compound deposition on non-crystalline substrates is a promising route for large area optoelectronic applications such as photovoltaic, light-emission, or infrared detector devices.

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Research Organization:: Energy Frontier Research Centers (EFRC) (United States). Center for Solar and Thermal Energy Conversion (CSTEC)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0000957; FG02-06ER46273; AC02-06CH11357

OSTI ID:: 1370084

Alternate ID(s):: OSTI ID: 1226576

Journal Information:: Applied Physics Letters, Vol. 105, Issue 22; Related Information: CSTEC partners with University of Michigan (lead); Kent State University; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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