RSVP: Soft Error Resilient Power Savings at Near-Threshold Voltage using Register Vulnerability
- Authors:
-
- Los Alamos National Laboratory
- Publication Date:
- Research Org.:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP)
- OSTI Identifier:
- 1369144
- Report Number(s):
- LA-UR-17-25325
- DOE Contract Number:
- AC52-06NA25396
- Resource Type:
- Conference
- Resource Relation:
- Conference: DSN 2017 ; 2017-06-26 - 2017-06-26 ; Denver, Colorado, United States
- Country of Publication:
- United States
- Language:
- English
- Subject:
- Computer Hardware; Computer Science
Citation Formats
Tan, Li, Debardeleben, Nathan A., Guan, Qiang, Blanchard, Sean P., and Lang, Michael Kenneth. RSVP: Soft Error Resilient Power Savings at Near-Threshold Voltage using Register Vulnerability. United States: N. p., 2017.
Web. doi:10.1109/DSN-W.2017.19.
Tan, Li, Debardeleben, Nathan A., Guan, Qiang, Blanchard, Sean P., & Lang, Michael Kenneth. RSVP: Soft Error Resilient Power Savings at Near-Threshold Voltage using Register Vulnerability. United States. https://doi.org/10.1109/DSN-W.2017.19
Tan, Li, Debardeleben, Nathan A., Guan, Qiang, Blanchard, Sean P., and Lang, Michael Kenneth. 2017.
"RSVP: Soft Error Resilient Power Savings at Near-Threshold Voltage using Register Vulnerability". United States. https://doi.org/10.1109/DSN-W.2017.19. https://www.osti.gov/servlets/purl/1369144.
@article{osti_1369144,
title = {RSVP: Soft Error Resilient Power Savings at Near-Threshold Voltage using Register Vulnerability},
author = {Tan, Li and Debardeleben, Nathan A. and Guan, Qiang and Blanchard, Sean P. and Lang, Michael Kenneth},
abstractNote = {},
doi = {10.1109/DSN-W.2017.19},
url = {https://www.osti.gov/biblio/1369144},
journal = {},
number = ,
volume = ,
place = {United States},
year = {Wed Jul 05 00:00:00 EDT 2017},
month = {Wed Jul 05 00:00:00 EDT 2017}
}
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