Determination of the laser intensity applied to a Ta witness plate from the measured X-ray signal using a pulsed micro-channel plate detector
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
The laser intensity distribution at the surface of a high-Z material, such as Ta, can be deduced from imaging the self-emission of the produced x-ray spot using suitable calibration data. This paper presents a calibration method which uses the measured x-ray emissions from laser spots of di erent intensities hitting a Ta witness plate. The x-ray emission is measured with a micro-channel plate (MCP) based x-ray framing camera plus filters. Data from di erent positions on one MCP strip or from di erent MCP assemblies are normalized to each other using a standard candle laser beam spot at 1x1014 W/cm2 intensity. The distribution of the resulting dataset agrees with results from a pseudo spectroscopic model for laser intensities between 4 and 15x1013 W/cm2. The model is then used to determine the absolute scaling factor between the experimental results from assemblies using two di erent x-ray filters. The data and model method also allows unique calibration factors for each MCP system and each MCP gain to be compared. We also present simulation results investigating alternate witness plate materials (Ag, Eu and Au).
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC52-07NA27344
- OSTI ID:
- 1368031
- Report Number(s):
- LLNL-JRNL-716802
- Journal Information:
- High Energy Density Physics, Vol. 23; ISSN 1574-1818
- Publisher:
- ElsevierCopyright Statement
- Country of Publication:
- United States
- Language:
- English
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