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Title: Electrically coupling complex oxides to semiconductors: A route to novel material functionalities

Journal Article · · Journal of Materials Research
DOI:https://doi.org/10.1557/jmr.2016.496· OSTI ID:1358030
 [1];  [1];  [1];  [1];  [2];  [2];  [2];  [3];  [3];  [3];  [4];  [5];  [5]
  1. Univ. of Texas, Arlington, TX (United States). Dept. of Physics
  2. Yale Univ., New Haven, CT (United States). Dept. of Applied Physics. Center for Research on Interface Structures and Phenomena
  3. Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Physical Sciences Division
  4. Pacific Northwest National Lab. (PNNL), Richland, WA (United States). Enviromental Molecular Sciences Lab.
  5. Brookhaven National Lab. (BNL), Upton, NY (United States). Center for Functional Nanomaterials

Complex oxides and semiconductors exhibit distinct yet complementary properties owing to their respective ionic and covalent natures. By electrically coupling complex oxides to traditional semiconductors within epitaxial heterostructures, enhanced or novel functionalities beyond those of the constituent materials can potentially be realized. Essential to electrically coupling complex oxides to semiconductors is control of the physical structure of the epitaxially grown oxide, as well as the electronic structure of the interface. In this paper, we discuss how composition of the perovskite A- and B-site cations can be manipulated to control the physical and electronic structure of semiconductor—complex oxide heterostructures. Two prototypical heterostructures, Ba1-xSrxTiO3/Ge and SrZrxTi1-xO3/Ge, will be discussed. In the case of Ba1-xSrxTiO3/Ge, we discuss how strain can be engineered through A-site composition to enable the re-orientable ferroelectric polarization of the former to be coupled to carriers in the semiconductor. In the case of SrZrxTi1-xO3/Ge we discuss how B-site composition can be exploited to control the band offset at the interface. Finally, analogous to heterojunctions between compound semiconducting materials, control of band offsets, i.e., band-gap engineering, provides a pathway to electrically couple complex oxides to semiconductors to realize a host of functionalities.

Research Organization:
Brookhaven National Laboratory (BNL), Upton, NY (United States); Univ. of Texas, Arlington, TX (United States); Yale Univ., New Haven, CT (United States); Pacific Northwest National Laboratory (PNNL), Richland, WA (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES); USDOE Office of Science (SC), Biological and Environmental Research (BER); National Science Foundation (NSF)
Grant/Contract Number:
AC02-98CH10886; DMR-1508530; DMR-1309868
OSTI ID:
1358030
Report Number(s):
BNL-113868-2017-JA; R&D Project: 16060; 16060; KC0403020
Journal Information:
Journal of Materials Research, Vol. 32, Issue 2; ISSN 0884-2914
Publisher:
Materials Research SocietyCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 13 works
Citation information provided by
Web of Science

References (40)

A silicon-based photocathode for water reduction with an epitaxial SrTiO3 protection layer and a nanostructured catalyst journal December 2014
Spintronics: Fundamentals and applications journal April 2004
Epitaxial integration of perovskite-based multifunctional oxides on silicon journal May 2013
Crystalline Oxides on Silicon: The First Five Monolayers journal October 1998
Crystalline Oxides on Silicon journal April 2010
Precise Determination of the Valence-Band Edge in X-Ray Photoemission Spectra: Application to Measurement of Semiconductor Interface Potentials journal June 1980
Use of Negative Capacitance to Provide Voltage Amplification for Low Power Nanoscale Devices journal February 2008
Transport at the Epitaxial Interface between Germanium and Functional Oxides journal October 2015
Ferroelectric stability of BaTiO3 in a crystalline oxide on semiconductor structure journal August 2004
Metal-insulator transitions journal October 1998
Strain-modulated Mott transition in EuNiO 3 ultrathin films journal August 2013
Polar Heterostructure for Multifunction Devices: Theoretical Studies journal February 2005
Control of the magnetic and magnetotransport properties of La0.67Sr0.33MnO3 thin films through epitaxial strain journal April 2008
Electrical characteristics of epitaxially grown SrTiO 3 on silicon for metal-insulator-semiconductor gate dielectric applications journal April 2003
Band offsets of wide-band-gap oxides and implications for future electronic devices journal January 2000
Surface and interface chemical composition of thin epitaxial SrTiO3 and BaTiO3 films: Photoemission investigation journal August 2004
Band-Gap Engineering at a Semiconductor-Crystalline Oxide Interface journal February 2015
Effects of annealing and strain on La1−xCaxMnO3 thin films: A phase diagram in the ferromagnetic region journal September 1999
Band-Gap Engineering: From Physics and Materials to New Semiconductor Devices journal January 1987
Amorphous TiO2 coatings stabilize Si, GaAs, and GaP photoanodes for efficient water oxidation journal May 2014
Band offset and structure of SrTiO3 /Si(001) heterojunctions journal May 2001
Physics of thin-film ferroelectric oxides journal October 2005
A Monolithic Photovoltaic-Photoelectrochemical Device for Hydrogen Production via Water Splitting journal April 1998
Ferroelectric-field-effect-enhanced electroresistance in metal/ferroelectric/semiconductor tunnel junctions journal May 2013
Atomic Layer Deposition of Dielectrics on Ge and III–V Materials for Ultrahigh Performance Transistors journal July 2009
Band offsets at the epitaxial SrTiO 3 /SrZrO 3 (0 0 1) heterojunction journal January 2012
c-axis oriented epitaxial BaTiO3 films on (001) Si journal July 2006
Hysteretic electrical transport in BaTiO 3 /Ba 1− x Sr x TiO 3 /Ge heterostructures journal February 2014
Properties of epitaxial BaTiO 3 deposited on GaAs journal January 2013
Enhancement of Ferroelectricity in Strained BaTiO3 Thin Films journal November 2004
Field-effect transistors with SrHfO3 as gate oxide journal July 2006
A Landau Primer for Ferroelectrics book January 2007
Semiconductor core-level to valence-band maximum binding-energy differences: Precise determination by x-ray photoelectron spectroscopy journal August 1983
Control of octahedral connectivity in perovskite oxide heterostructures: An emerging route to multifunctional materials discovery journal March 2012
Effect of space charge on the polarization hysteresis characteristics of monolithic and compositionally graded ferroelectrics journal January 2010
Polarization dependence of Schottky barrier heights at interfaces of ferroelectrics determined by photoelectron spectroscopy journal September 2012
Two-dimensional electron gas in a modulation-doped SrTiO 3 /Sr(Ti, Zr)O 3 heterostructure journal August 2013
SrBi2Ta2O9 memory capacitor on Si with a silicon nitride buffer journal March 1998
Carrier density modulation in a germanium heterostructure by ferroelectric switching journal January 2015
Hetero-epitaxy of perovskite oxides on GaAs(001) by molecular beam epitaxy journal August 2004

Cited By (6)

Interfacial Structure of SrZr$_{x}$Ti$_{1-x}$O$_3$ films on Ge text January 2018
Crystalline SrZrO 3 deposition on Ge (001) by atomic layer deposition for high- k dielectric applications journal July 2018
Polarization-controlled modulation doping of a ferroelectric from first principles journal March 2018
Epitaxial Oxides on Semiconductors: From Fundamentals to New Devices journal July 2019
Interfacial structure of SrZr x Ti 1− x O 3 films on Ge journal November 2018
Polarization-controlled modulation doping of a ferroelectric from first principles text January 2017

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