Angular correlations of photons from solution diffraction at a free-electron laser encode molecular structure
- Stanford Univ., Stanford, CA (United States)
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Arizona State Univ., Tempe, AZ (United States)
- Japan Synchrotron Radiation Research Institute (JASRI) (Japan)
- RIKEN SPring-8 Center (Japan)
- Stanford Univ., Stanford, CA (United States); SLAC National Accelerator Lab., Menlo Park, CA (United States)
During X-ray exposure of a molecular solution, photons scattered from the same molecule are correlated. If molecular motion is insignificant during exposure, then differences in momentum transfer between correlated photons are direct measurements of the molecular structure. In conventional small- and wide-angle solution scattering, photon correlations are ignored. This report presents advances in a new biomolecular structural analysis technique, correlated X-ray scattering (CXS), which uses angular intensity correlations to recover hidden structural details from molecules in solution. Due to its intense rapid pulses, an X-ray free electron laser (XFEL) is an excellent tool for CXS experiments. A protocol is outlined for analysis of a CXS data set comprising a total of half a million X-ray exposures of solutions of small gold nanoparticles recorded at the Spring-8 Ångström Compact XFEL facility (SACLA). From the scattered intensities and their correlations, two populations of nanoparticle domains within the solution are distinguished: small twinned, and large probably non-twinned domains. Finally, it is shown analytically how, in a solution measurement, twinning information is only accessible via intensity correlations, demonstrating how CXS reveals atomic-level information from a disordered solution of like molecules.
- Research Organization:
- SLAC National Accelerator Lab., Menlo Park, CA (United States)
- Sponsoring Organization:
- USDOE
- Grant/Contract Number:
- AC02-76SF00515
- OSTI ID:
- 1348987
- Journal Information:
- IUCrJ, Vol. 3, Issue 6; ISSN 2052-2525
- Publisher:
- International Union of CrystallographyCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Web of Science
Monitoring Nanocrystal Self‐Assembly in Real Time Using In Situ Small‐Angle X‐Ray Scattering
|
journal | April 2019 |
Fluctuation X-ray scattering from nanorods in solution reveals weak temperature-dependent orientational ordering
|
journal | May 2019 |
Local orientational order in self-assembled nanoparticle films: the role of ligand composition and salt
|
text | January 2019 |
Local orientational order in self-assembled nanoparticle films: the role of ligand composition and salt
|
journal | July 2019 |
Monitoring Nanocrystal Self-Assembly in Real Time Using In Situ Small-Angle X-Ray Scattering
|
text | January 2019 |
Similar Records
Multispectroscopic Study of Single Xe Clusters Using XFEL Pulses
Small-angle X-ray scattering method to characterize molecular interactions: Proof of concept