New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy

Sachan, Ritesh; Zhang, Yanwen; Ou, Xin; Trautmann, Christina; Chisholm, Matthew F.; Weber, William J.

doi:10.1557/jmr.2016.418

Title: New insights on ion track morphology in pyrochlores by aberration corrected scanning transmission electron microscopy

Journal Article · Tue Dec 13 00:00:00 EST 2016 · Journal of Materials Research

DOI:https://doi.org/10.1557/jmr.2016.418· OSTI ID:1348323

^[1]; Zhang, Yanwen ^[2];

^[3]; Trautmann, Christina ^[4]; Chisholm, Matthew F. ^[1]; Weber, William J. ^[2]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Univ. of Tennessee, Knoxville, TN (United States)
Helmholtz-Zentrum Dresden (HZB), (Germany)
Technical Univ. of Darmstadt (Germany); GSI-Helmholtzzentrum fur Schwerionenforschung, Darmstadt (Germany)

Here we demonstrate the enhanced imaging capabilities of an aberration corrected scanning transmission electron microscope to advance the understanding of ion track structure in pyrochlore structured materials (i.e., Gd₂Ti₂O₇ and Gd₂TiZrO₇). Track formation occurs due to the inelastic transfer of energy from incident ions to electrons, and atomic-level details of track morphology as a function of energy-loss are revealed in the present work. A comparison of imaging details obtained by varying collection angles of detectors is discussed in the present work. A quantitative analysis of phase identification using high-angle annular dark field imaging is performed on the ion tracks. Finally, a novel 3-dimensional track reconstruction method is provided that is based on depth dependent imaging of the ion tracks. The technique is used in extracting the atomic-level details of nanoscale features, such as the disordered ion tracks, which are embedded in relatively thicker matrix. Another relevance of the method is shown by measuring the tilt of the ion tracks relative to the electron beam incidence that helps in knowing the structure and geometry of ion tracks quantitatively.

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1348323

Journal Information:: Journal of Materials Research, Vol. 32, Issue 05; ISSN 0884-2914

Publisher:: Materials Research SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 11 works

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