Comparison of dielectric properties of additively manufactured vs. solvent cast polyimide dielectrics
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
The permittivity, dielectric loss, and DC dielectric breakdown strength of additively manufactured, solvent-cast, and commercial polyimide films are reported As expected, commercial films performed better than both AM and solvent-cast lab-made films. Solvent-cast films generally performed better than AM films, although performance depended on the optimization of the material for the specific deposition technique. The most significant degradation of performance in all the lab-made films was in the dispersion of both the x/Df measurements and the dielectric breakdown strength (Weibull β). Commercial films had a breakdown strength of 4891 kV/cm and β = 13.0 whereas the highest performing lab-made films had a breakdown strength of 4072 kV/cm and β = 3.8. Furthermore, this increase in dispersion in all the lab-made samples is attributed to higher variability in the preparation, a higher defect level related to fabrication in the lab environment and, for some AM samples, to morphology/topology features resulting from the deposition technique.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- Grant/Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1344474
- Report Number(s):
- SAND-2016-6113J; 642750
- Journal Information:
- IEEE Transactions on Dielectrics and Electrical Insulation, Journal Name: IEEE Transactions on Dielectrics and Electrical Insulation
- Country of Publication:
- United States
- Language:
- English
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