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Title: Attenuation Drift in the Micro-Computed Tomography System at LLNL

Technical Report ·
DOI:https://doi.org/10.2172/1342004· OSTI ID:1342004

The maximum allowable level of drift in the linear attenuation coefficients (μ) for a Lawrence Livermore National Laboratory (LLNL) micro-computed tomography (MCT) system was determined to be 0.1%. After ~100 scans were acquired during the period of November 2014 to March 2015, the drift in μ for a set of six reference materials reached or exceeded 0.1%. Two strategies have been identified to account for or correct the drift. First, normalizing the 160 kV and 100 kV μ data by the μ of water at the corresponding energy, in contrast to conducting normalization at the 160 kV energy only, significantly compensates for measurement drift. Even after the modified normalization, μ of polytetrafluoroethylene (PTFE) increases linearly with scan number at an average rate of 0.00147% per scan. This is consistent with PTFE radiation damage documented in the literature. The second strategy suggested is the replacement of the PTFE reference with fluorinated ethylene propylene (FEP), which has the same effective atomic number (Ze) and electron density (ρe) as PTFE, but is 10 times more radiation resistant. This is important as effective atomic number and electron density are key parameters in analysis. The presence of a material with properties such as PTFE, when taken together with the remaining references, allows for a broad range of the (Ze, ρe) feature space to be used in analysis. While FEP is documented as 10 times more radiation resistant, testing will be necessary to assess how often, if necessary, FEP will need to be replaced. As radiation damage to references has been observed, it will be necessary to monitor all reference materials for radiation damage to ensure consistent x-ray characteristics of the references.

Research Organization:
Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC52-07NA27344
OSTI ID:
1342004
Report Number(s):
LLNL-TR-687901
Country of Publication:
United States
Language:
English

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