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Title: Reviewed approach to defining the Active Interlock Envelope for Front End ray tracing

Abstract

To protect the NSLS-II Storage Ring (SR) components from damage from synchrotron radiation produced by insertion devices (IDs) the Active Interlock (AI) keeps electron beam within some safe envelope (a.k.a Active Interlock Envelope or AIE) in the transverse phase space. The beamline Front Ends (FEs) are designed under assumption that above certain beam current (typically 2 mA) the ID synchrotron radiation (IDSR) fan is produced by the interlocked e-beam. These assumptions also define how the ray tracing for FE is done. To simplify the FE ray tracing for typical uncanted ID it was decided to provide the Mechanical Engineering group with a single set of numbers (x,x’,y,y’) for the AIE at the center of the long (or short) ID straight section. Such unified approach to the design of the beamline Front Ends will accelerate the design process and save valuable human resources. In this paper we describe our new approach to defining the AI envelope and provide the resulting numbers required for design of the typical Front End.

Authors:
 [1];  [1]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
Publication Date:
Research Org.:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
OSTI Identifier:
1340327
Report Number(s):
BNL-108464-2015-IR
DOE Contract Number:  
SC0012704
Resource Type:
Technical Report
Country of Publication:
United States
Language:
English
Subject:
43 PARTICLE ACCELERATORS; synchrotron; light source; active interlock envelope; interlock; synchrotron radiation; safety; equipment protection

Citation Formats

Seletskiy, S., and Shaftan, T. Reviewed approach to defining the Active Interlock Envelope for Front End ray tracing. United States: N. p., 2015. Web. doi:10.2172/1340327.
Seletskiy, S., & Shaftan, T. Reviewed approach to defining the Active Interlock Envelope for Front End ray tracing. United States. https://doi.org/10.2172/1340327
Seletskiy, S., and Shaftan, T. 2015. "Reviewed approach to defining the Active Interlock Envelope for Front End ray tracing". United States. https://doi.org/10.2172/1340327. https://www.osti.gov/servlets/purl/1340327.
@article{osti_1340327,
title = {Reviewed approach to defining the Active Interlock Envelope for Front End ray tracing},
author = {Seletskiy, S. and Shaftan, T.},
abstractNote = {To protect the NSLS-II Storage Ring (SR) components from damage from synchrotron radiation produced by insertion devices (IDs) the Active Interlock (AI) keeps electron beam within some safe envelope (a.k.a Active Interlock Envelope or AIE) in the transverse phase space. The beamline Front Ends (FEs) are designed under assumption that above certain beam current (typically 2 mA) the ID synchrotron radiation (IDSR) fan is produced by the interlocked e-beam. These assumptions also define how the ray tracing for FE is done. To simplify the FE ray tracing for typical uncanted ID it was decided to provide the Mechanical Engineering group with a single set of numbers (x,x’,y,y’) for the AIE at the center of the long (or short) ID straight section. Such unified approach to the design of the beamline Front Ends will accelerate the design process and save valuable human resources. In this paper we describe our new approach to defining the AI envelope and provide the resulting numbers required for design of the typical Front End.},
doi = {10.2172/1340327},
url = {https://www.osti.gov/biblio/1340327}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Thu Sep 24 00:00:00 EDT 2015},
month = {Thu Sep 24 00:00:00 EDT 2015}
}