The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy

Zaluzec, Nestor J.

doi:10.1016/j.ultramic.2014.09.012

Title: The influence of C_s/C_c correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy

Abstract

Aberration correction in scanning/transmission electron microscopy (S/TEM) owes much to the efforts of a small dedicated group of innovators. Leading that frontier has been Prof. Harald Rose. To date his leadership and dynamic personality has spearheaded our ability to leave behind many of the limitations imposed by spherical aberration (C_s) in high resolution phase contrast imaging. Following shortly behind, has been the development of chromatic aberration correction (C_c) which augments those accomplishments. In this study we will review and summarize how the combination of C_s/C_c technology enhances our ability to conduct hyperspectral imaging and spectroscopy in today's and future computationally mediated experiments in both thin as well as realistic specimens in vacuo and during in-situ/environmental experiments.

Authors:

Zaluzec, Nestor J. ^[1]

Argonne National Lab. (ANL), Argonne, IL (United States)

Publication Date:: Tue Nov 11 00:00:00 EST 2014

Research Org.:: Argonne National Lab. (ANL), Argonne, IL (United States)

Sponsoring Org.:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

OSTI Identifier:: 1339285

Alternate Identifier(s):: OSTI ID: 1247883

Grant/Contract Number:: AC02-06CH11357

Resource Type:: Journal Article: Accepted Manuscript

Journal Name:: Ultramicroscopy

Additional Journal Information:: Journal Volume: 151; Journal Issue: C; Journal ID: ISSN 0304-3991

Publisher:: Elsevier

Country of Publication:: United States

Language:: English

Subject:: 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; AEM; aberration correction; amplitude contrast; EELS; EFTEM; HREM; phase contrast; XEDS; in-situ; tomography

Citation Formats


                    Zaluzec, Nestor J. The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy.  United States: N. p., 2014. 
        Web.  doi:10.1016/j.ultramic.2014.09.012.

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                    Zaluzec, Nestor J. The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy.  United States.  https://doi.org/10.1016/j.ultramic.2014.09.012

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                    Zaluzec, Nestor J. 2014.  
        "The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy".  United States.  https://doi.org/10.1016/j.ultramic.2014.09.012.  https://www.osti.gov/servlets/purl/1339285.

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@article{osti_1339285,

  title        = {The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy},

  author       = {Zaluzec, Nestor J.},

  abstractNote = {Aberration correction in scanning/transmission electron microscopy (S/TEM) owes much to the efforts of a small dedicated group of innovators. Leading that frontier has been Prof. Harald Rose. To date his leadership and dynamic personality has spearheaded our ability to leave behind many of the limitations imposed by spherical aberration (Cs) in high resolution phase contrast imaging. Following shortly behind, has been the development of chromatic aberration correction (Cc) which augments those accomplishments. In this study we will review and summarize how the combination of Cs/Cc technology enhances our ability to conduct hyperspectral imaging and spectroscopy in today's and future computationally mediated experiments in both thin as well as realistic specimens in vacuo and during in-situ/environmental experiments.},

  doi          = {10.1016/j.ultramic.2014.09.012},

  url          = {https://www.osti.gov/biblio/1339285},
  journal      = {Ultramicroscopy},

  issn         = {0304-3991},

  number       = C,

  volume       = 151,

  place        = {United States},

  year         = {Tue Nov 11 00:00:00 EST 2014},

  month        = {Tue Nov 11 00:00:00 EST 2014}

}

Copy to clipboard

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Works referencing / citing this record:

Resolution and aberration correction in liquid cell transmission electron microscopy
journal, December 2018

de Jonge, Niels; Houben, Lothar; Dunin-Borkowski, Rafal E.
Nature Reviews Materials, Vol. 4, Issue 1
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De Jonge, Niels; Houben, Lothar; Dunin-Borkowski, Rafal E.
Universität des Saarlandes
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Title: The influence of Cs/Cc correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy

Abstract

Citation Formats

Correction of aberrations, a promising means for improving the spatial and energy resolution of energy-filtering electron microscopes journal, November 1994

Aberration correction past and present journal, September 2009

Progress and problems for atomic-resolution electron microscopy journal, March 2012

Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction journal, February 2014

Electron microscopy image enhanced journal, April 1998

Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy journal, December 1992

Sub-Ångstrom high-resolution transmission electron microscopy at 300keV journal, November 2001

Electron holography—basics and applications journal, December 2007

First application of Cc-corrected imaging for high-resolution and energy-filtered TEM journal, April 2009

Current and future aberration correctors for the improvement of resolution in electron microscopy journal, September 2009

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit journal, September 2008

Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy Using Hardware Aberration Correction journal, May 2006

High-Resolution Transmission Electron Microscopy Using Negative Spherical Aberration journal, March 2004

On the benefit of the negative-spherical-aberration imaging technique for quantitative HRTEM journal, April 2010

Breaking the spherical and chromatic aberration barrier in transmission electron microscopy journal, February 2005

Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration journal, July 2010

Atomic imaging in aberration-corrected high-resolution transmission electron microscopy journal, January 2004

Amplitude Contrast Imaging: High Resolution Electron Microscopy Using a Spherical and Chromatic Aberration Corrected TEM journal, August 2014

Direct structure inversion from exit waves journal, April 2010

Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM journal, July 2012

To Cc or Not to Cc: That is the Question! journal, July 2012

Real-time imaging and local elemental analysis of nanostructures in liquids journal, January 2014

Approaching Tissue Ultrastructure in 3D journal, August 2013

Top-bottom effect in energy-selecting transmission electron microscopy journal, January 1987

Thick specimens in the CEM and STEM. Resolution and image formation journal, July 1975

A High‐Resolution Scanning Transmission Electron Microscope journal, December 1968

Visibility of Single Atoms journal, June 1970

Atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy journal, March 2010

Structure of the InAlAs/InP interface by atomically resolved energy dispersive spectroscopy journal, October 2011

Chemical mapping at atomic resolution using energy-dispersive x-ray spectroscopy journal, January 2012

Atomic-Resolution X-ray Energy-Dispersive Spectroscopy Chemical Mapping of Substitutional Dy Atoms in a High-Coercivity Neodymium Magnet journal, May 2013

Quantitative Elemental Mapping at Atomic Resolution Using X-Ray Spectroscopy journal, February 2014

Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivity journal, December 1993

Towards sub-Å electron beams journal, June 1999

Two-Dimensional Mapping of Chemical Information at Atomic Resolution journal, August 2007

Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy journal, February 2008

Spectrum-image: The next step in EELS digital acquisition and processing journal, April 1989

High Angular Resolution Electron Channeling X-ray/Electron Spectroscopy journal, July 2012

Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope journal, May 2014

On the Performance of XEDS and EELS in the AEM: 25 Years Later journal, July 2011

In Situ Electron Energy-Loss Spectroscopy in Liquids journal, May 2013

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Resolution and aberration correction in liquid cell transmission electron microscopy journal, December 2018

Resolution and aberration correction in liquid cell transmission electron microscopy collection, January 2018

Title: The influence of C_s/C_c correction in analytical imaging and spectroscopy in scanning and transmission electron microscopy

Correction of aberrations, a promising means for improving the spatial and energy resolution of energy-filtering electron microscopes
journal, November 1994

Aberration correction past and present
journal, September 2009

Progress and problems for atomic-resolution electron microscopy
journal, March 2012

Seeing and measuring with electrons: Transmission electron microscopy today and tomorrow – An introduction
journal, February 2014

Electron microscopy image enhanced
journal, April 1998

Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
journal, December 1992

Sub-Ångstrom high-resolution transmission electron microscopy at 300keV
journal, November 2001

Electron holography—basics and applications
journal, December 2007

First application of Cc-corrected imaging for high-resolution and energy-filtered TEM
journal, April 2009

Current and future aberration correctors for the improvement of resolution in electron microscopy
journal, September 2009

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit
journal, September 2008

Progress in Aberration-Corrected High-Resolution Transmission Electron Microscopy Using Hardware Aberration Correction
journal, May 2006

High-Resolution Transmission Electron Microscopy Using Negative Spherical Aberration
journal, March 2004

On the benefit of the negative-spherical-aberration imaging technique for quantitative HRTEM
journal, April 2010

Breaking the spherical and chromatic aberration barrier in transmission electron microscopy
journal, February 2005

Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration
journal, July 2010

Atomic imaging in aberration-corrected high-resolution transmission electron microscopy
journal, January 2004

Amplitude Contrast Imaging: High Resolution Electron Microscopy Using a Spherical and Chromatic Aberration Corrected TEM
journal, August 2014

Direct structure inversion from exit waves
journal, April 2010

Atomic Resolution Energy-Filtered HREM at High-Loss Region Using Cs- and Cc-Corrected TEM
journal, July 2012

To Cc or Not to Cc: That is the Question!
journal, July 2012

Real-time imaging and local elemental analysis of nanostructures in liquids
journal, January 2014

Approaching Tissue Ultrastructure in 3D
journal, August 2013

Top-bottom effect in energy-selecting transmission electron microscopy
journal, January 1987

Thick specimens in the CEM and STEM. Resolution and image formation
journal, July 1975

A High‐Resolution Scanning Transmission Electron Microscope
journal, December 1968

Visibility of Single Atoms
journal, June 1970

Atomic-resolution chemical mapping using energy-dispersive x-ray spectroscopy
journal, March 2010

Structure of the InAlAs/InP interface by atomically resolved energy dispersive spectroscopy
journal, October 2011

Chemical mapping at atomic resolution using energy-dispersive x-ray spectroscopy
journal, January 2012

Atomic-Resolution X-ray Energy-Dispersive Spectroscopy Chemical Mapping of Substitutional Dy Atoms in a High-Coercivity Neodymium Magnet
journal, May 2013

Quantitative Elemental Mapping at Atomic Resolution Using X-Ray Spectroscopy
journal, February 2014

Simultaneous STEM imaging and electron energy-loss spectroscopy with atomic-column sensitivity
journal, December 1993

Towards sub-Å electron beams
journal, June 1999

Two-Dimensional Mapping of Chemical Information at Atomic Resolution
journal, August 2007

Atomic-Scale Chemical Imaging of Composition and Bonding by Aberration-Corrected Microscopy
journal, February 2008

Spectrum-image: The next step in EELS digital acquisition and processing
journal, April 1989

High Angular Resolution Electron Channeling X-ray/Electron Spectroscopy
journal, July 2012

Analytical Formulae for Calculation of X-Ray Detector Solid Angles in the Scanning and Scanning/Transmission Analytical Electron Microscope
journal, May 2014

On the Performance of XEDS and EELS in the AEM: 25 Years Later
journal, July 2011

In Situ Electron Energy-Loss Spectroscopy in Liquids
journal, May 2013

New opportunities for In situ Science Based on the TEAM Platform
journal, July 2011

Upper limits for the residual aberrations of a high-resolution aberration-corrected STEM
journal, April 2000

Prerequisites for a Cc/Cs-corrected ultrahigh-resolution TEM
journal, February 2008

Resolution and aberration correction in liquid cell transmission electron microscopy
journal, December 2018

Resolution and aberration correction in liquid cell transmission electron microscopy
collection, January 2018