Stacked, filtered multi-channel X-ray diode array
- National Security Technologies, LLC. (NSTec), Mercury, NV (United States)
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
There are many types of X-ray diodes used for X-ray flux or spectroscopic measurements and for estimating the spectral shape of the VUV to soft X-ray spectrum. However, a need exists for a low-cost, robust X-ray diode to use for experiments in hostile environments on multiple platforms, and for experiments that utilize forces that may destroy the diode(s). Since the typical proposed use required a small size with a minimal single line-of-sight, a parallel array could not be used. So, a stacked, filtered multi-channel X-ray diode array was developed, called the MiniXRD. To achieve significant cost savings while maintaining robustness and ease of field setup, repair, and replacement, we designed the system to be modular. The filters were manufactured in-house and cover the range from 450 eV to 5000 eV. To achieve the line-of-sight accuracy needed, we developed mounts and laser alignment techniques. We modeled and tested elements of the diode design at NSTec Livermore Operations (NSTec / LO) to determine temporal response and dynamic range, leading to diode shape and circuitry changes to optimize impedance and charge storage. The authors fielded individual and stacked systems at several national facilities as ancillary "ride-along" diagnostics to test and improve the design usability. This paper presents the MiniXRD system performance, which supports consideration as a viable low-costalternative for multiple-channel low-energy X-ray measurements. This diode array is currently at Technical Readiness Level (TRL) 6.
- Research Organization:
- National Security Technologies, LLC (NSTec), Mercury, NV (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA), Office of Defense Programs (DP)
- DOE Contract Number:
- AC52-06NA25946
- OSTI ID:
- 1334796
- Report Number(s):
- DOE/NV/25946-2581
- Journal Information:
- Proceedings of SPIE Optics + Photonics 2015 Conference, Conference: SPIE Optics + Photonics 2015 Conference, San Diego, CA (United States), 9-13 Aug 2015
- Publisher:
- SPIE, PO Box 10, Bellingham, WA 98227-0010 USA
- Country of Publication:
- United States
- Language:
- English
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