Power Cycle Testing of Power Switches: A Literature Survey
Journal Article
·
· IEEE Transactions on Power Electronics
- Univ. of Tennessee, Knoxville, TN (United States). Dept. of Electrical Engineering and Computer Science
- Univ. of Tennessee, Knoxville, TN (United States). Dept. of Electrical Engineering and Computer Scienc; Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Power Electronics and Electric Machinery Group
Reliability of power converters and lifetime prediction has been a major topic of research in the last few decades, especially for traction applications. The main failures in high power semiconductors are caused by thermomechanical fatigue. Power cycling and temperature cycling are the two most common thermal acceleration tests used in assessing reliability. The objective of this paper is to study the various power cycling tests found in the literature and to develop generalized steps in planning application specific power cycling tests. A comparison of different tests based on the failures, duration, test circuits, and monitored electrical parameters is presented.
- Research Organization:
- Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Oak Ridge National Environmental Research Park
- Sponsoring Organization:
- USDOE; National Science Foundation (NSF)
- Grant/Contract Number:
- AC05-00OR22725; EEC-1041877
- OSTI ID:
- 1325461
- Journal Information:
- IEEE Transactions on Power Electronics, Vol. 30, Issue 5; ISSN 0885-8993
- Publisher:
- IEEECopyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 92 works
Citation information provided by
Web of Science
Web of Science
Similar Records
Correlation of Qualification and Accelerated Testing with Field Degradation
Final Technical Report on Quantifying Dependability Attributes of Software Based Safety Critical Instrumentation and Control Systems in Nuclear Power Plants
Application of Electronics Packaging Fundamentals to Photovoltaic Interconnects and Packaging
Technical Report
·
Fri Aug 31 00:00:00 EDT 2018
·
OSTI ID:1325461
+4 more
Final Technical Report on Quantifying Dependability Attributes of Software Based Safety Critical Instrumentation and Control Systems in Nuclear Power Plants
Technical Report
·
Fri Mar 25 00:00:00 EDT 2016
·
OSTI ID:1325461
+1 more
Application of Electronics Packaging Fundamentals to Photovoltaic Interconnects and Packaging
Conference
·
Mon Dec 09 00:00:00 EST 2019
·
OSTI ID:1325461