Thermal Neutron Imaging Using A New Pad-Based Position Sensitive Neutron Detector
Thermal neutrons (with mean energy of 25 meV) have a scattering mean free path of about 20 m in air. Therefore it is feasible to find localized thermal neutron sources up to ~30 m standoff distance using thermal neutron imaging. Coded aperture thermal neutron imaging was developed in our laboratory in the nineties, using He-3 filled wire chambers. Recently a new generation of coded-aperture neutron imagers has been developed. In the new design the ionization chamber has anode and cathode planes, where the anode is composed of an array of individual pads. The charge is collected on each of the individual 5x5 mm2 anode pads, (48x48 in total, corresponding to 24x24 cm2 sensitive area) and read out by application specific integrated circuits (ASICs). The high sensitivity of the ASICs allows unity gain operation mode. The new design has several advantages for field deployable imaging applications, compared to the previous generation of wire-grid based neutron detectors. Among these are the rugged design, lighter weight and use of non-flammable stopping gas. For standoff localization of thermalized neutron sources a low resolution (11x11 pixel) coded aperture mask has been fabricated. Using the new larger area detector and the coarse resolution mask we performed several standoff experiments using moderated californium and plutonium sources at Idaho National Laboratory. In this paper we will report on the development and performance of the new pad-based neutron camera, and present long range coded-aperture images of various thermalized neutron sources.
- Research Organization:
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA), Office of Nonproliferation and Verification Research and Development (NA-22)
- DOE Contract Number:
- SC00112704
- OSTI ID:
- 1324258
- Report Number(s):
- BNL-112162-2016-CP; R&D Project: 21745/21745; DN2001000
- Resource Relation:
- Conference: 2016 IEEE NSS/MIC Conference; Strasbourg, France; 20161029 through 20161106
- Country of Publication:
- United States
- Language:
- English
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