Reliability Characterization of Wide-Bandgap Semiconductor Switches.

Conference · Tue Oct 01 00:00:00 EDT 2013

OSTI ID:1314228

Kaplar, Robert; Hughart, David Russell; Flicker, Jack David; Atcitty, Stanley; Marinella, Matthew

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1314228
• Report Number(s): SAND2013-8716C; 533424
• Resource Relation: Conference: Proposed for presentation at the Electrical Energy Storage Applications and Technologies held October 21-23, 2013 in San Diego, CA.
• Country of Publication: United States
• Language: English