Using benchmarks for radiation testing of microprocessors and FPGAs

Journal Article · Thu Dec 17 00:00:00 EST 2015 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/TNS.2015.2498313· OSTI ID:1312569

Quinn, Heather ^[1]; Robinson, William H. ^[2]; Rech, Paolo ^[3]; Aguirre, Miguel ^[4]; Barnard, Arno ^[5]; Desogus, Marco ^[6]; Entrena, Luis ^[7]; Garcia-Valderas, Mario ^[7]; Guertin, Steven M. ^[8]; Kaeli, David ^[9]; Kastensmidt, Fernanda Lima ^[3]; Kiddie, Bradley T. ^[2]; Sanchez-Clemente, Antonio ^[7]; Reorda, Matteo Sonza ^[6]; Sterpone, Luca ^[6]; Wirthlin, Michael ^[10]

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1. Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
2. Vanderbilt Univ., Nashville, TN (United States)
3. Univ. Federal do Rio Grande do Sul, Porto Alegre (Brasil)
4. Univ. de Sevilla, Sevilla (Spain)
5. Stellenbosch Univ., Stellenbosch (South Africa)
6. Politecnico di Torino, Torino (Italy)
7. Univ. Carlos III de Madrid, Madrid (Spain)
8. California Institute of Technology, Pasadena, CA (United States)
9. Northeastern Univ., Boston, MA (United States)
10. Brigham Young Univ., Provo, UT (United States)

• Research Organization: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
• Sponsoring Organization: USDOE
• Grant/Contract Number: AC52-06NA25396
• OSTI ID: 1312569
• Alternate ID(s): OSTI ID: 1356128
• Report Number(s): LA-UR-15-24958; LA-UR-15-28660
• Journal Information: IEEE Transactions on Nuclear Science, Vol. 62, Issue 6; Conference: IEEE NSREC, Boston, MA (United States), 13 Jul 2015; ISSN 0018-9499
• Publisher: Institute of Electrical and Electronics Engineers (IEEE)
• Country of Publication: United States
• Language: English

Related Subjects

97 MATHEMATICS AND COMPUTING
software fault tolerance
Field-programmable gate arrays (FPGAs)
soft error rates
soft errors