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Title: Total dose and SEU hardness assurance qualification issues for microelectronics.

Conference ·
OSTI ID:1268236

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1268236
Report Number(s):
SAND2007-4348C; 517840
Resource Relation:
Conference: Proposed for presentation at the Ninth European Conf. Radiation & Its Effects on Components and Systems held September 10-14, 2007 in Deauville, France.
Country of Publication:
United States
Language:
English