Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy

Li, Qian; Jesse, Stephen; Tselev, Alexander; Collins, Liam; Yu, Pu; Kravchenko, Ivan; Kalinin, Sergei V.; Balke, Nina

doi:10.1021/nn506753u

Title: Probing local bias-induced transitions using photothermal excitation contact resonance atomic force microscopy and voltage spectroscopy

Journal Article · Mon Jan 05 00:00:00 EST 2015 · ACS Nano

DOI:https://doi.org/10.1021/nn506753u· OSTI ID:1265373

Li, Qian ^[1]; Jesse, Stephen ^[1]; Tselev, Alexander ^[1]; Collins, Liam ^[2]; Yu, Pu ^[3]; Kravchenko, Ivan ^[1]; Kalinin, Sergei V. ^[1]; Balke, Nina ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)
University College Dublin, Belfield, Dublin (Ireland). School of Physics.
Tsinghua Univ., Beijing (China). State Key Laboratory for Low-Dimensional Quantum Physics, Department of Physics.

In this paper, nanomechanical properties are closely related to the states of matter, including chemical composition, crystal structure, mesoscopic domain configuration, etc. Investigation of these properties at the nanoscale requires not only static imaging methods, e.g., contact resonance atomic force microscopy (CR-AFM), but also spectroscopic methods capable of revealing their dependence on various external stimuli. Here we demonstrate the voltage spectroscopy of CR-AFM, which was realized by combining photothermal excitation (as opposed to the conventional piezoacoustic excitation method) with the band excitation technique. We applied this spectroscopy to explore local bias-induced phenomena ranging from purely physical to surface electromechanical and electrochemical processes. Our measurements show that the changes in the surface properties associated with these bias-induced transitions can be accurately assessed in a fast and dynamic manner, using resonance frequency as a signature. Finally, with many of the advantages offered by photothermal excitation, contact resonance voltage spectroscopy not only is expected to find applications in a broader field of nanoscience but also will provide a basis for future development of other nanoscale elastic spectroscopies.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1265373

Journal Information:: ACS Nano, Vol. 9, Issue 2; ISSN 1936-0851

Publisher:: American Chemical Society (ACS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 34 works

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