Percolation Threshold Effects on the Electrical Contact Resistance and Adhesion of Microelectromechanical Systems Thin-Film Materials.
Conference
·
OSTI ID:1264645
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1264645
- Report Number(s):
- SAND2006-6290C; 524998
- Resource Relation:
- Conference: Proposed for presentation at the MS&T06 Conference held October 16-19, 2006 in Cincinnati, OH.
- Country of Publication:
- United States
- Language:
- English
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