Electronic and magnetic properties of manganite thin films with different compositions and its correlation with transport properties: An X-ray resonant magnetic scattering study

Singh, Surendra; Freeland, J. W.; Fitzsimmons, M. R.; Jeen, H.; Biswas, A.

doi:10.1063/1.4902959

Title: Electronic and magnetic properties of manganite thin films with different compositions and its correlation with transport properties: An X-ray resonant magnetic scattering study

Journal Article · Mon Dec 08 00:00:00 EST 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4902959· OSTI ID:1246345

Singh, Surendra ^[1]; Freeland, J. W. ^[2]; Fitzsimmons, M. R. ^[3];

^[4]; Biswas, A. ^[5]

Bhabha Atomic Research Center, Mumbai (India)
Argonne National Lab. (ANL), Argonne, IL (United States)
Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
Univ. of Florida, Gainesville, FL (United States); Pusan National Univ., Busan (Korea)
Univ. of Florida, Gainesville, FL (United States)

Here, we present x-ray resonant magnetic dichroism and x-ray resonant magnetic scattering measurements of the temperature dependence of magnetism in Pr-doped La-Ca-Mn-O films grown on (110) NdGaO3 substrates. We observed thermal hysteresis of the ferromagnetism in one film that also showed large thermal hysteresis of ~18K in transport measurements. While in a second film of a different nominal chemistry, which showed very small thermal hysteresis ~3K in transport measurements, no thermal hysteresis of the ferromagnetism was observed. As a result, these macroscopic properties are correlated with evolution of surface magnetization across metal insulator transition for these films as observed by soft x-ray resonant magnetic scattering measurements.

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Research Organization:: Los Alamos National Lab. (LANL), Los Alamos, NM (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC52-06NA25396

OSTI ID:: 1246345

Report Number(s):: LA-UR-14-29648; JAPIAU

Journal Information:: Journal of Applied Physics, Vol. 116, Issue 22; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 4 works

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