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Title: The study of frequency-scan photothermal reflectance technique for thermal diffusivity measurement

Abstract

A frequency scan photothermal reflectance technique to measure thermal diffusivity of bulk samples is studied in this manuscript. Similar to general photothermal reflectance methods, an intensity-modulated heating laser and a constant intensity probe laser are used to determine the surface temperature response under sinusoidal heating. The approach involves fixing the distance between the heating and probe laser spots, recording the phase lag of reflected probe laser intensity with respect to the heating laser frequency modulation, and extracting thermal diffusivity using the phase lag – (frequency)1/2 relation. The experimental validation is performed on three samples (SiO2, CaF2 and Ge), which have a wide range of thermal diffusivities. The measured thermal diffusivity values agree closely with literature values. Lastly, compared to the commonly used spatial scan method, the experimental setup and operation of the frequency scan method are simplified, and the uncertainty level is equal to or smaller than that of the spatial scan method.

Authors:
 [1];  [1];  [2]
  1. Utah State Univ., Logan, UT (United States)
  2. Idaho National Lab. (INL), Idaho Falls, ID (United States)
Publication Date:
Research Org.:
Idaho National Lab. (INL), Idaho Falls, ID (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1245830
Report Number(s):
INL/JOU-14-33926
Journal ID: ISSN 0034-6748; RSINAK
Grant/Contract Number:  
AC07-05ID14517
Resource Type:
Journal Article: Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 5; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
11 NUCLEAR FUEL CYCLE AND FUEL MATERIALS; thermal conductivity; thermal wave; thermal diffusion; laser heating; laser beams; photothermal effects; error analysis

Citation Formats

Hua, Zilong, Ban, Heng, and Hurley, David H. The study of frequency-scan photothermal reflectance technique for thermal diffusivity measurement. United States: N. p., 2015. Web. doi:10.1063/1.4919609.
Hua, Zilong, Ban, Heng, & Hurley, David H. The study of frequency-scan photothermal reflectance technique for thermal diffusivity measurement. United States. https://doi.org/10.1063/1.4919609
Hua, Zilong, Ban, Heng, and Hurley, David H. 2015. "The study of frequency-scan photothermal reflectance technique for thermal diffusivity measurement". United States. https://doi.org/10.1063/1.4919609. https://www.osti.gov/servlets/purl/1245830.
@article{osti_1245830,
title = {The study of frequency-scan photothermal reflectance technique for thermal diffusivity measurement},
author = {Hua, Zilong and Ban, Heng and Hurley, David H.},
abstractNote = {A frequency scan photothermal reflectance technique to measure thermal diffusivity of bulk samples is studied in this manuscript. Similar to general photothermal reflectance methods, an intensity-modulated heating laser and a constant intensity probe laser are used to determine the surface temperature response under sinusoidal heating. The approach involves fixing the distance between the heating and probe laser spots, recording the phase lag of reflected probe laser intensity with respect to the heating laser frequency modulation, and extracting thermal diffusivity using the phase lag – (frequency)1/2 relation. The experimental validation is performed on three samples (SiO2, CaF2 and Ge), which have a wide range of thermal diffusivities. The measured thermal diffusivity values agree closely with literature values. Lastly, compared to the commonly used spatial scan method, the experimental setup and operation of the frequency scan method are simplified, and the uncertainty level is equal to or smaller than that of the spatial scan method.},
doi = {10.1063/1.4919609},
url = {https://www.osti.gov/biblio/1245830}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 5,
volume = 86,
place = {United States},
year = {Tue May 05 00:00:00 EDT 2015},
month = {Tue May 05 00:00:00 EDT 2015}
}

Journal Article:
Free Publicly Available Full Text
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Citation Metrics:
Cited by: 12 works
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Works referenced in this record:

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Works referencing / citing this record:

Electronic contribution in heat transfer at metal-semiconductor and metal silicide-semiconductor interfaces
journal, July 2018


Fiber-based modulated optical reflectance configuration allowing for offset pump and probe beams
journal, December 2016