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Title: Single-contact tunneling thermometry

Patent ·
OSTI ID:1239684

A single-contact tunneling thermometry circuit includes a tunnel junction formed between two objects. Junction temperature gradient information is determined based on a mathematical relationship between a target alternating voltage applied across the junction and the junction temperature gradient. Total voltage measured across the junction indicates the magnitude of the target alternating voltage. A thermal gradient is induced across the junction. A reference thermovoltage is measured when zero alternating voltage is applied across the junction. An increasing alternating voltage is applied while measuring a thermovoltage component and a DC rectification voltage component created by the applied alternating voltage. The target alternating voltage is reached when the thermovoltage is nullified or doubled by the DC rectification voltage depending on the sign of the reference thermovoltage. Thermoelectric current and current measurements may be utilized in place of the thermovoltage and voltage measurements. The system may be automated with a feedback loop.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-00OR22725
Assignee:
UT-Battelle, LLC (Oak Ridge, TN)
Patent Number(s):
9,267,851
Application Number:
13/898,659
OSTI ID:
1239684
Resource Relation:
Patent File Date: 2013 May 21
Country of Publication:
United States
Language:
English

References (12)

Nanoscale thermal transport journal January 2003
Nanoscale thermal management journal January 2002
Scanning Thermal Microscopy journal August 1999
Spatially and temporally resolved thermal imaging of cyclically heated interconnects by use of scanning thermal microscopy journal August 2008
Application of scanning thermal microscopy for thermal conductivity measurements on meso-porous silicon thin films journal October 2007
Quantitative Thermometry of Nanoscale Hot Spots journal January 2012
Thermoelectricity in Molecular Junctions journal March 2007
Thermopower in scanning-tunneling-microscope experiments journal November 1990
Method and apparatus for performing localized thermal analysis and sub-surface imaging by scanning thermal microscopy patent December 2002
High resolution scanning thermal probe and method of manufacturing thereof patent February 2003
Scanning probe microscope assembly patent August 2006
Probe for scanning thermal microscope patent April 2009

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