skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Platelet composite coatings for tin whisker mitigation

Journal Article · · Journal of Electronic Materials
 [1];  [1]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)

In this study, reliable methods for tin whisker mitigation are needed for applications that utilize tin-plated commercial components. Tin can grow whiskers that can lead to electrical shorting, possibly causing critical systems to fail catastrophically. The mechanisms of tin whisker growth are unclear and this makes prediction of the lifetimes of critical components uncertain. The development of robust methods for tin whisker mitigation is currently the best approach to eliminating the risk of shorting. Current mitigation methods are based on unfilled polymer coatings that are not impenetrable to tin whiskers. In this paper we report tin whisker mitigation results for several filled polymer coatings. The whisker-penetration resistance of the coatings was evaluated at elevated temperature and high humidity and under temperature cycling conditions. The composite coatings comprised Ni and MgF2-coated Al/Ni/Al platelets in epoxy resin or silicone rubber. In addition to improved whisker mitigation, these platelet composites have enhanced thermal conductivity and dielectric constant compared with unfilled polymers.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1236220
Report Number(s):
SAND-2015-8335J; 606340
Journal Information:
Journal of Electronic Materials, Vol. 44, Issue 11; ISSN 0361-5235
Publisher:
SpringerCopyright Statement
Country of Publication:
United States
Language:
English

Similar Records

Mitigation of tin whisker growth by inserting Ni nanocones
Journal Article · Fri Dec 15 00:00:00 EST 2017 · Materials Characterization · OSTI ID:1236220

Long-term thermal aging of parylene conformal coating under high humidity and its effects on tin whisker mitigation
Journal Article · Tue Jul 06 00:00:00 EDT 2021 · Polymer Degradation and Stability · OSTI ID:1236220

Tin Whisker Formation - A Stress Relieve Phenomenon
Journal Article · Tue Feb 07 00:00:00 EST 2006 · AIP Conference Proceedings · OSTI ID:1236220