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Title: Systems and methods for sample analysis

Abstract

The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.

Inventors:
; ; ;
Publication Date:
Research Org.:
Purdue Univ., West Lafayette, IN (United States)
Sponsoring Org.:
USDOE
OSTI Identifier:
1223693
Patent Number(s):
9,165,752
Application Number:
14/566,838
Assignee:
Purdue Research Foundation (West Lafayette, IN)
DOE Contract Number:  
FG02-06ER15807
Resource Type:
Patent
Resource Relation:
Patent File Date: 2014 Dec 11
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY

Citation Formats

Cooks, Robert Graham, Li, Guangtao, Li, Xin, and Ouyang, Zheng. Systems and methods for sample analysis. United States: N. p., 2015. Web.
Cooks, Robert Graham, Li, Guangtao, Li, Xin, & Ouyang, Zheng. Systems and methods for sample analysis. United States.
Cooks, Robert Graham, Li, Guangtao, Li, Xin, and Ouyang, Zheng. 2015. "Systems and methods for sample analysis". United States. https://www.osti.gov/servlets/purl/1223693.
@article{osti_1223693,
title = {Systems and methods for sample analysis},
author = {Cooks, Robert Graham and Li, Guangtao and Li, Xin and Ouyang, Zheng},
abstractNote = {The invention generally relates to systems and methods for sample analysis. In certain embodiments, the invention provides a system for analyzing a sample that includes a probe including a material connected to a high voltage source, a device for generating a heated gas, and a mass analyzer.},
doi = {},
url = {https://www.osti.gov/biblio/1223693}, journal = {},
number = ,
volume = ,
place = {United States},
year = {Tue Oct 20 00:00:00 EDT 2015},
month = {Tue Oct 20 00:00:00 EDT 2015}
}

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