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Title: Electron beam diagnostic system using computed tomography and an annular sensor

Patent ·
OSTI ID:1209341
;

A system for analyzing an electron beam including a circular electron beam diagnostic sensor adapted to receive the electron beam, the circular electron beam diagnostic sensor having a central axis; an annular sensor structure operatively connected to the circular electron beam diagnostic sensor, wherein the sensor structure receives the electron beam; a system for sweeping the electron beam radially outward from the central axis of the circular electron beam diagnostic sensor to the annular sensor structure wherein the electron beam is intercepted by the annular sensor structure; and a device for measuring the electron beam that is intercepted by the annular sensor structure.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC52-07NA27344
Assignee:
Lawrence Livermore National Security, LLC (Livermore, CA)
Patent Number(s):
9,105,448
Application Number:
14/305,905
OSTI ID:
1209341
Resource Relation:
Patent File Date: 2014 Jun 16
Country of Publication:
United States
Language:
English

References (13)

Method of measuring and stabilizing the diameter of heating point on workpiece in electron beam welding machine and on automatic device for realization thereof patent June 1979
Electron detector for use in a gaseous environment patent January 1990
Charged particle beam device patent July 1990
Method of automatic measurement and focus of an electron beam and apparatus therefor patent January 1996
System for high resolution imaging and measurement of topographic and material features on a specimen patent July 1997
Enhanced modified faraday cup for determination of power density distribution of electron beams patent October 2001
Method for measuring the intensity profile of an electron beam, in particular a beam of an electron-beam machining device, and/or for measuring an optical system for an electron beam and/or for adjusting an optical system for an electron beam, measuring structure for such a method and electron-beam machining device patent December 2005
Trigger probe for determining the orientation of the power distribution of an electron beam patent July 2007
Electron beam profile measurement system and method with optional Faraday cup patent September 2013
Electron beam diagnostic system using computed tomography and an annular sensor patent July 2014
Micro-joining using electron beams patent-application September 2006
Miniature Modified Faraday Cup for Micro Electron Beams patent-application April 2008
Beam Imaging Sensor patent-application November 2013

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