Method for using polarization gating to measure a scattering sample

Baba, Justin S.

Title: Method for using polarization gating to measure a scattering sample

Patent · Tue Aug 04 00:00:00 EDT 2015

OSTI ID:1207242

Baba, Justin S.

Described herein are systems, devices, and methods facilitating optical characterization of scattering samples. A polarized optical beam can be directed to pass through a sample to be tested. The optical beam exiting the sample can then be analyzed to determine its degree of polarization, from which other properties of the sample can be determined. In some cases, an apparatus can include a source of an optical beam, an input polarizer, a sample, an output polarizer, and a photodetector. In some cases, a signal from a photodetector can be processed through attenuation, variable offset, and variable gain.

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Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC05-00OR22725

Assignee:: UT-Battelle, LLC (Oak Ridge, TN)

Patent Number(s):: 9,097,647

Application Number:: 13/962,826

OSTI ID:: 1207242

Resource Relation:: Patent File Date: 2013 Aug 08

Country of Publication:: United States

Language:: English

References (31)

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