Fly-scan ptychography
- Brookhaven National Lab. (BNL), Upton, NY (United States)
- SLAC National Accelerator Laboratory, Menlo Park, CA (United States); Center for Free-Electron Laser Science, Deutsches Elektronensynchrotron, Hamburg (Germany)
- Argonne National Lab. (ANL), Argonne, IL (United States)
- Univ. College London, London (United Kingdom). London Centre for Nanotechnology; Research Complex at Harwell, Oxfordshire (United Kingdom)
We report an experimental ptychography measurement performed in fly-scan mode. With a visible-light laser source, we demonstrate a 5-fold reduction of data acquisition time. By including multiple mutually incoherent modes into the incident illumination, high quality images were successfully reconstructed from blurry diffraction patterns. Thus, this approach significantly increases the throughput of ptychography, especially for three-dimensional applications and the visualization of dynamic systems.
- Research Organization:
- Brookhaven National Laboratory (BNL), Upton, NY (United States); Argonne National Laboratory (ANL), Argonne, IL (United States); SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)
- Sponsoring Organization:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- Grant/Contract Number:
- AC02-98CH10886; AC02-06CH11357; AC03-76SF00515
- OSTI ID:
- 1201502
- Alternate ID(s):
- OSTI ID: 1222219; OSTI ID: 1222644
- Journal Information:
- Scientific Reports, Vol. 5, Issue 1; ISSN 2045-2322
- Publisher:
- Nature Publishing GroupCopyright Statement
- Country of Publication:
- United States
- Language:
- English
Cited by: 60 works
Citation information provided by
Web of Science
Web of Science
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