Pseudorotational epitaxy of self-assembled octadecyltrichlorosilane monolayers on sapphire (0001)

Steinrück, H. -G.; Magerl, A.; Deutsch, M.; Ocko, B. M.

doi:10.1103/PhysRevLett.113.156101

Title: Pseudorotational epitaxy of self-assembled octadecyltrichlorosilane monolayers on sapphire (0001)

Journal Article · Mon Oct 06 00:00:00 EDT 2014 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.113.156101· OSTI ID:1182499

Steinrück, H. -G. ^[1]; Magerl, A. ^[1]; Deutsch, M. ^[2]; Ocko, B. M. ^[3]

Univ. of Erlangen-Nurnberg, Erlangen (Germany)
Bar-Ilan Univ., Ramat-Gan (Israel)
Brookhaven National Lab. (BNL), Upton, NY (United States)

The structure of octadecyltrichlorosilane self-assembled monolayers (SAMs) on sapphire (0001) was studied by Å-resolution surface-specific x-ray scattering methods. The monolayer was found to consist of three sublayers where the outermost layer corresponds to vertically oriented, closely packed alkyl tails. Laterally, the monolayer is hexagonally packed and exhibits pseudorotational epitaxy to the sapphire, manifested by a broad scattering peak at zero relative azimuthal rotation, with long powderlike tails. The lattice mismatch of ~1% – 3% to the sapphire’s and the different length scale introduced by the lateral Si-O-Si bonding prohibit positional epitaxy. However, the substrate induces an intriguing increase in the crystalline coherence length of the SAM’s powderlike crystallites when rotationally aligned with the sapphire’s lattice. As a result, the increase correlates well with the rotational dependence of the separation of corresponding substrate-monolayer lattice sites.

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Research Organization:: Brookhaven National Laboratory (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC00112704; AC02-76CH0016

OSTI ID:: 1182499

Alternate ID(s):: OSTI ID: 1181133

Report Number(s):: BNL-107401-2015-JA; PRLTAO; R&D Project: PO034; KC0203010

Journal Information:: Physical Review Letters, Vol. 113, Issue 15; ISSN 0031-9007

Publisher:: American Physical Society (APS)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 13 works

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