skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Faster processing of multiple spatially-heterodyned direct to digital holograms

Patent ·
OSTI ID:1175925

Systems and methods are described for faster processing of multiple spatially-heterodyned direct to digital holograms. A method includes of obtaining multiple spatially-heterodyned holograms, includes: digitally recording a first spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis; digitally recording a second spatially-heterodyned hologram including spatial heterodyne fringes for Fourier analysis; Fourier analyzing the recorded first spatially-heterodyned hologram by shifting a first original origin of the recorded first spatially-heterodyned hologram including spatial heterodyne fringes in Fourier space to sit on top of a spatial-heterodyne carrier frequency defined as a first angle between a first reference beam and a first, object beam; applying a first digital filter to cut off signals around the first original origin and performing an inverse Fourier transform on the result; Fourier analyzing the recorded second spatially-heterodyned hologram by shifting a second original origin of the recorded second spatially-heterodyned hologram including spatial heterodyne fringes in Fourier space to sit on top of a spatial-heterodyne carrier frequency defined as a second angle between a second reference beam and a second object beam; and applying a second digital filter to cut off signals around the second original origin and performing an inverse Fourier transform on the result, wherein digitally recording the first spatially-heterodyned hologram is completed before digitally recording the second spatially-heterodyned hologram and a single digital image includes both the first spatially-heterodyned hologram and the second spatially-heterodyned hologram.

Research Organization:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
AC05-00OR22725
Assignee:
UT-Battelle LLC (Oak Ridge, TN)
Patent Number(s):
7,116,425
Application Number:
10/607,840
OSTI ID:
1175925
Country of Publication:
United States
Language:
English

References (17)

Pulsed digital holographic interferometry with 694- and 347-nm wavelengths journal January 2000
Quantitative evaluation of two-dimensional dynamic deformations using digital holography journal July 1997
Advanced electron holography: a new algorithm for image processing and a standardized quality test for the FEG electron microscope journal April 1995
Multipulsed digital holography applied to full 3D measurements of dynamic events
  • Mendoza Santoyo, Fernando; Pedrini, Giancarlo; Schedin, Staffan
  • Laser Metrology for Precision Management and Inspection in Industry, SPIE Proceedings https://doi.org/10.1117/12.439203
conference September 2001
A software package for the processing and reconstruction of electron holograms journal October 1995
Direct to digital holography for semiconductor wafer defect detection and review
  • Thomas, Jr., C. E.; Bahm, Tracy M.; Baylor, Larry R.
  • Design, Process Integration, and Characterization for Microelectronics, SPIE Proceedings https://doi.org/10.1117/12.475659
conference July 2002
Wavefront Reconstruction with Diffused Illumination and Three-Dimensional Objects* journal January 1964
Fracional–Fringe Holographic Plasma Interferometry journal January 1967
Reconstructed Wavefronts and Communication Theory* journal January 1962
Holographic Interferometry journal February 1966
High-resolution photomask transmission and phase measurement tool conference July 2002
Wavefront Reconstruction with Continuous-Tone Objects* journal January 1963
Holographic Interferometry Cookbook report January 1972
Holographic Interferometry book January 1994
The extended Fourier algorithm: Application in discrete optics and electron holography journal January 1994
Direct sampling and demodulation of carrier-frequency signals journal October 2002
Holographic interferometric microscope for complete displacement determination journal September 1997