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Title: Nanoscale Morphology Evolution Under Ion Irradiation

Technical Report ·
DOI:https://doi.org/10.2172/1163734· OSTI ID:1163734
 [1]
  1. President & Fellows of Harvard College, Cambridge, MA (United States)

We showed that the half-century-old paradigm of morphological instability under irradiation due to the curvature-dependence of the sputter yield, can account neither for the phase diagram nor the amplification or decay rates that we measure in the simplest possible experimental system -- an elemental semiconductor with an amorphous surface under noble-gas ion irradiation; We showed that a model of pattern formation based on the impact-induced redistribution of atoms that do not get sputtered away explains our experimental observations; We developed a first-principles, parameter-free approach for predicting morphology evolution, starting with molecular dynamics simulations of single ion impacts, lasting picoseconds, and upscaling through a rigorous crater-function formalism to develop a partial differential equation that predicts morphology evolution on time scales more than twelve orders of magnitude longer than can be covered by the molecular dynamics; We performed the first quantitative comparison of the contributions to morphological instability from sputter removal and from impact-induced redistribution of atoms that are removed, and showed that the former is negligible compared to the latter; We established a new paradigm for impact-induced morphology evolution based on crater functions that incorporate both redistribution and sputter effects; and We developed a model of nanopore closure by irradiation-induced stress and irradiationenhanced fluidity, for the near-surface irradiation regime in which nuclear stopping predominates, and showed that it explains many aspects of pore closure kinetics that we measure experimentally.

Research Organization:
President & Fellows of Harvard College, Cambridge, MA (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
FG02-06ER46335
OSTI ID:
1163734
Report Number(s):
DOE-HARVARD-ER46335
Country of Publication:
United States
Language:
English

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