Flip-Chip and Backside Techniques Seminar ISTFA'07.

Conference · Mon Oct 01 00:00:00 EDT 2007

OSTI ID:1146607

Cole, Edward I.; Barton, Daniel L.; Bernhard-Hofer, Karoline

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1146607
• Report Number(s): SAND2007-7088C; 521274
• Resource Relation: Conference: Proposed for presentation at the International Symposium for Testing and Failure Analysis held November 4-8, 2007 in San Jose, CA.
• Country of Publication: United States
• Language: English